GLAST/LAT >
DAQ and FSW >
FSW >
Doxygen Index >
SIB / V1-0-2
Constituent: sib_eeprom_test     Tag: rad750
Interface Compound List File List Compound Members File Members
Synopsis
Name
sib_eeprom_test
- SIB EEPROM hardware level test
Usage
sib_eeprom_test <drv> <chip>
Description
This tests writes four test patterns into every location within an SIB EEPROM chip. A chip is defined as 128 KB x 4 (0.5 MB), or the size of one Austin EEPROM MCM. Values of 0xaaaaaaaa, 0x55555555, 0x00000000, and 0xffffffff are written and verified for each location. Errors are reported as encoutered. The drv parameter should be '0' for a lower EEPROM bank chip and '1' for an upper EEPROM bank chip. The chip parameter is an integer, and for standard SIB 3 MB EEPROM banks, should range from '0' to '5'.
Generated on Sat Jun 5 02:54:36 2004 by
1.3.3