J.P. Duke, A.P. Letchford, D.J.S. Findlay (Rutherford Appleton Laboratory, Oxfordshire, England)
Measurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.
Comments or Questions to
linac2000@slac.stanford.edu