Next Linear Collider Test Accelerator
Binary Format is used.
Archived Files copied to Development (Tar,
Maintenance Cron Job
NFS Toaster Space
EPICS Software Support
All data files (.dat) were written on a fault. The data from the
first module looked good. However, the data on all subsequent modules looked
like noise. In addition, the led on the front panel of all of the
Joergers were "ON" all of time, not just after a fault occurred.
An input signal from card 0, with data that looked good, was swapped with
a channel from card 1, a fault was generated and the result was that the
data on card 0 looked good and the data from all subsequent modules looked
like noise. An known signal (sin wave) was input to a channel on card 1,
a fault was generated, the data on card 0 looked good and the the data
from the card 1 channel with a sin wave input, looked as expected.
However, all other data looked like noise. The final test done, was to
generate a square wave as the input signal to a channel on card 1, generate
a fault and then repeate the test on a channel on card 0. The data should
look the same, however this test revealed that the square wave (or portion
of the square wave) was shifted. Those involved with the test were Mark
Ross, Janis Nelson, Joe Frisch, and Kristi Luchini.
Digitizer Module Diagnostic
The users can get to this display from the TARF Main display by selecting
the TR00 Modus button
off Station 0, 1 or 2 displays. Once you are on the TR00 VME
Modules display for Slow Data
Acquisition you can then select any of the buttons labled "DTIZ".
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Contact: Kristi L. Luchini
Last modified: Wednesday, Jul 24, 2002