ID LAT ACD Subsystem Level IV Requirements and Verification Table, LAT-SS-00352 Verification Method Component/Subassembly Verification (if any) Procedure & hardware Component/Subassembly Verification (if any) Status ACD System Verification Procedure ACD System Verification Stage/Status Work Order Auth. (WOA) Test Report if seperate from WOA Links
ACD4-1 LAT-SS-00352-01-D10
... ... ... ... ... ... ... ...
ACD4-2 Gamma-ray Large Area Space Telescope
... ... ... ... ... ... ... ...
ACD4-3 (GLAST)
... ... ... ... ... ... ... ...
ACD4-4 Large Area Telescope (LAT)
... ... ... ... ... ... ... ...
ACD4-5 Anticoincidence Detector (ACD)
... ... ... ... ... ... ... ...
ACD4-6 Subsystem Level 4 Requirements/Specification
... ... ... ... ... ... ... ...
ACD4-7 1 PURPOSE
... ... ... ... ... ... ... ...
ACD4-8 2 SCOPE
... ... ... ... ... ... ... ...
ACD4-9 3 DEFINITIONS
... ... ... ... ... ... ... ...
ACD4-10 4 APPLICABLE DOCUMENTS
... ... ... ... ... ... ... ...
ACD4-11 5 REQUIREMENTS
... ... ... ... ... ... ... ...
ACD4-12 5.1 System Information
... ... ... ... ... ... ... ...
ACD4-20 Science signals from the TDA's and their associated PMT's are defined in terms of MIP's, the signal generated by a minimum-ionizing singly-charged particle traversing a tile in a direction normal to its surface. To provide a meaningful electronics specification, the definition of a MIP must be normalized to the electrical charge delivered by each of the two PMT's in response to a MIP. The following parameters are assumed for the MIP calculation:
... ... ... ... ... ... ... ...
ACD4-21 10 photoelectrons per PMT per MIP
... ... ... ... ... ... ... ...
ACD4-22 PMT gain of 400,000
... ... ... ... ... ... ... ...
ACD4-23 The result is that 1 MIP produces a PMT anode signal of 0.64 pC.
... ... ... ... ... ... ... ...
ACD4-24 In the requirements shown below, allowance has been made (and noted) for differential degradation of the PMT's within a board. This effect forces a broadening of the range of adjustability of the discriminators in sections 5.3, 5.6, and 5.9.2.
... ... ... ... ... ... ... ...
ACD4-25 5.2 Charged Particle Detection
... ... ... ... ... ... ... ...
ACD4-26 The ACD shall produce both fast and logic (hitmap) VETO signals in response to PMT signals resulting from charged particles traversing the ACD tiles and ribbons.
Test N/A N/A ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
The ACD shall detect energy deposits wit
(ACD3-16)
(IN)
ACD4-27 5.3 Adjustable Threshold on VETO Detection of Charged Particles
... ... ... ... ... ... ... ...
ACD4-28 The threshold for detecting charged particles shall be adjustable from 0.064 to 1.28 pC (0.1 to 2 MIP), with a step size of <0.032 pC (0.05 MIP).
Test FREE Comp Perf Test, ACD-Proc-000051.
Section 11.16
(Also checked in GAFE chip testing)
Completed succesfully ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)

Chassis Full Functional Test ( ACD-PROC-000222 )
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site, http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
(ACD4-146)
(OUT)
The threshold for VETO detection of char (ACD3-18)(IN)
ACD4-29 5.4 False VETO due to Electrical Noise
... ... ... ... ... ... ... ...
ACD4-30 The total ACD false VETO trigger rate due to noise shall be less than 10 kHz (~46Hz per channel) at 0.096 pC (0.15 MIP) threshold (assuming 1 us VETO pulses).
Analysis, Test, Simulation Elect Int Test , ACD-PROC-000164), Sec 5.2, 5.3 Done. Hard to measure once TDAs are attached.
ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
The false VETO signal rate due to noise
(ACD3-28)
(IN)
ACD4-31 5.5 High-Threshold Detection
... ... ... ... ... ... ... ...
ACD4-32 The ACD shall detect pulses due to highly-ionizing particles (carbon-nitrogen-oxygen or heavier nuclei), which produce signals from 31.2 - 200 MIP (20 pC to 128 pC) with a goal of 1000 MIP (640 pC). The ACD is required to detect, via the High-Level Discriminator (HLD), all signals above the High-Level threshold (nominally 25 MIP's); it is required to digitize (PHA) signals up to 200 MIP's (128 pC). The current design actually allows for digitization of signals up to 1000 MIP's (640 pC).

Each ACD electronics board shall OR up to 18 HLD outputs (selected via command) to generate a single HLD_OR signal for transmission to the AEM.
Test, Simulation FREE Comp Perf Test, ACD-Proc-000051.
Section 11.16
(TCI)

Chassis Full Functional Test ( ACD-PROC-000222 )

Done




Done
ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270) up to ~200 MIP

ACD Margin Test (ACD-PROC-000352)

FREE Functional Test ( ACD-PROC-000051 ) from 200 to 1000 MIP, no req to fully test above 200 MIP.

Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
The ACD shall detect highly-ionizing par
(ACD3-30)
(IN)
ACD4-34 5.6 Adjustable High-Threshold
... ... ... ... ... ... ... ...
ACD4-35 The High-Level Threshold shall be adjustable for PMT signals from 12.8 to 40.96 pC (20 to 64 MIP) in steps of 0.64 pC (1 MIP) ±20%. HOWEVER As of Oct 2003 the GAFE 5G and GAFE 7, one of which should be our flight chip, do not quite meet this requirement as stated. On those chips The High Level Discriminator is adjustable from 0 - 130 MIP in steps less than 1.6 MIP/step. This adjustablility still allows us to meet all of our related requirements. So this is likely to be our flight performance. See related NCR

Test FREE Comp Perf Test, ACD-Proc-000051.



Chassis Full Functional Test ( ACD-PROC-000222 )
Done




Done
ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)

FREE Functional Test ( ACD-PROC-000051 )
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
(ACD4-148)
(OUT)
The High-Threshold shall be adjustable f (ACD3-32)(IN)
ACD4-36 5.7 Level 1 Trigger Acknowledge (TACK)
... ... ... ... ... ... ... ...
ACD4-37 The ACD electronics shall accept from the GEM a Level 1 Trigger Acknowledge signal and respond by digitizing and latching data.
Test FREE Comp Perf Test, ACD-Proc-000051.
Section 11.16


Chassis Full Functional Test ( ACD-PROC-000222 )
Done




Done
ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)

Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
10.    ACD Command and Data Format    27
(ACDICD-46)
(IN)
ACD4-38 5.8 Signals
... ... ... ... ... ... ... ...
ACD4-39 5.8.1 Fast VETO (VETO_AEM) Signal Latency
... ... ... ... ... ... ... ...
ACD4-40 The fast VETO signal latency shall be 100<tlatent<600 nsec from the time of particle passage. The time jitter in the VETO pulses shall be <200 ns relative to particle passage. (‘Deglitch’ circuit raised min latency to 100 nsec from 50 nsec).
Test FREE Comp Perf Test, ACD-Proc-000051.
Section 11
Verified

FREE 0102, Chassis 4LA, WOA ACD-00022 Event 220 FREE 0103, Chassis 2RA, WOA ACD-00023 Event 220 FREE 0104, Chassis 2LA, WOA ACD-00024 Event 220 FREE 0106, Chassis 4RA, WOA ACD-00026 Event 220 FREE 1102, Chassis 1RB, WOA ACD-00028 Event 220 FREE 1103, Chassis 4LB, WOA ACD-00029 Event 220 FREE 1104, Chassis 3LA, WOA ACD-00030 Event 220 FREE 1105, Chassis 3RB, WOA ACD-00031 Event 220 FREE 1107, Chassis 2RB, WOA ACD-00033 Event 220 FREE 1108, Chassis 2LB, WOA ACD-00034 Event 220 FREE 1109, Chassis 4RB, WOA ACD-00035 Event 220 FREE 11010, Chassis 1LA, WOA ACD-00036 Event 220
Not directly verifiable at system level, see subsystem verification Qualification See subassembly verification See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
ACD-INT-02318
(ACD4-50)
(OUT)
For each PMT, a fast VETO signal shall b
(ACD3-34)
(IN)
The fast VETO signal latency shall be co
(ACD3-36)
(IN)
ACD4-41 5.8.2 Fast VETO (VETO_AEM) Signal Width
... ... ... ... ... ... ... ...
ACD4-42 The fast VETO output signal shall have a commandable width of 50 - 400 nsec, after ‘de-glitching’ on 2 successive clock pulses. The leading and trailing edges must be synchronous with clock pulses.
Test FREE Comp Perf Test, ACD-Proc-000051.
Section 11.5
Verified
FREE 0102, Chassis 4LA, WOA ACD-00022 Event 220 FREE 0103, Chassis 2RA, WOA ACD-00023 Event 220 FREE 0104, Chassis 2LA, WOA ACD-00024 Event 220 FREE 0106, Chassis 4RA, WOA ACD-00026 Event 220 FREE 1102, Chassis 1RB, WOA ACD-00028 Event 220 FREE 1103, Chassis 4LB, WOA ACD-00029 Event 220 FREE 1104, Chassis 3LA, WOA ACD-00030 Event 220 FREE 1105, Chassis 3RB, WOA ACD-00031 Event 220 FREE 1107, Chassis 2RB, WOA ACD-00033 Event 220 FREE 1108, Chassis 2LB, WOA ACD-00034 Event 220 FREE 1109, Chassis 4RB, WOA ACD-00035 Event 220 FREE 11010, Chassis 1LA, WOA ACD-00036 Event 220
Not directly verifiable at system level, see subsystem verification Qualification See subassembly verification See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The fast VETO output signal shall have a
(ACD3-44)
(IN)
The dead time shall be less than 1 msec
(ACD3-430)
(IN)
For a signal equivalent to 200 MIP's, th
(ACD3-46)
(IN)
ACD4-43 5.8.3 Fast VETO (VETO_AEM) Retriggering
... ... ... ... ... ... ... ...
ACD4-44 After a Fast VETO discriminator pulse, the time during which the
discriminator cannot be retriggered shall be no more than 50 ns.
Test FREE Functional Test ( ACD-PROC-000051 ) Verified
FREE 0102, Chassis 4LA, WOA ACD-00022 Event 220 FREE 0103, Chassis 2RA, WOA ACD-00023 Event 220 FREE 0104, Chassis 2LA, WOA ACD-00024 Event 220 FREE 0106, Chassis 4RA, WOA ACD-00026 Event 220 FREE 1102, Chassis 1RB, WOA ACD-00028 Event 220 FREE 1103, Chassis 4LB, WOA ACD-00029 Event 220 FREE 1104, Chassis 3LA, WOA ACD-00030 Event 220 FREE 1105, Chassis 3RB, WOA ACD-00031 Event 220 FREE 1107, Chassis 2RB, WOA ACD-00033 Event 220 FREE 1108, Chassis 2LB, WOA ACD-00034 Event 220 FREE 1109, Chassis 4RB, WOA ACD-00035 Event 220 FREE 11010, Chassis 1LA, WOA ACD-00036 Event 220
Not directly verifiable at system level, see subsystem verification
Qualification N/A Check ACD Test report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The average detection efficiency for min
(ACD3-20)
(IN)
ACD4-45 5.8.4 Logic VETO (VETO_Hitmap) Signal
... ... ... ... ... ... ... ...
ACD4-46 A map of VETO signals shall be generated for each TACK, indicating which ACD PMT's produced signals above their thresholds within ~200 ns of the time of the event causing the TACK. (Note: The ~200 ns window is required because of time jitter in the TACK signal).
Test FREE Comp Perf Test, ACD-Proc-000051.
Section 11.7

Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)
Hitmap Syncronization )

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The dead time shall be less than 1 msec
(ACD3-430)
(IN)
A map of the tiles that produce VETO sig
(ACD3-38)
(IN)
The logic VETO map shall represent the s
(ACD3-42)
(IN)
ACD4-47 5.8.5 Logic VETO (VETO_Hitmap) Signal Latency
... ... ... ... ... ... ... ...
ACD4-48 In response to a TACK, the map of VETO signals shall be latched by the time the ADC conversions are complete.
Test FREE Comp Perf Test, ACD-Proc-000051.
Section 11.7

Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)

Chassis Full Functional Test ( ACD-PROC-000222 )
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The map of VETO signals shall be latched
(ACD3-40)
(IN)
ACD4-49 5.8.6 High-Threshold Signal Latency
... ... ... ... ... ... ... ...
ACD4-50 A highly-ionizing particle hitting the top or upper side row of tiles of the ACD shall produce a High-Threshold fast signal that will be delivered to the AEM with latency of no more than that the latency as defined for the fast VETO in specification 5.8.1. Command-selected signals out of the eighteen (18) High-Threshold fast signals generated on a single electronics board shall be OR'ed to produce a single signal for transmission to the AEM.
Test FREE Comp Perf Test, ACD-Proc-000051 Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270) with TCI

ACD Margin Test (ACD-PROC-000352) with TCI

Chassis Full Functional Test ( ACD-PROC-000222 )
(measured at ACD level with TCI)
Qualification, Acceptance ACD-INT-02318 (with TCI)
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The fast VETO signal latency shall be 10
(ACD4-40)
(IN)
A highly-ionizing particle hitting the t
(ACD3-48)
(IN)
ACD4-51 5.8.7 Discriminator Masking
... ... ... ... ... ... ... ...
ACD4-52 Each ACD electronics board shall have the capability to disable any combination of the Fast VETO and HLD discriminator outputs. This is to mask unused HLD signals, unpopulated veto channels, and signals due to channel failure.
Test FREE Comp Perf Test, ACD-Proc-000051
Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
(ACD4-52)
(OUT)
The ACD shall detect highly-ionizing par
(ACD3-30)
(IN)
ACD4-53 5.8.8 ACD Trigger Primitives
... ... ... ... ... ... ... ...
ACD4-54 This requirement deleted for ACD. The ACD will produce no trigger primitives internally. The VETO signals caused by the individual PMT's will be transmitted to the GEM, where they will be OR'ed together (for each tile or ribbon), and used by the GEM to generate trigger primitives.
... N/A ... N/A                ... N/A ... The ACD will produce no trigger primitiv
(ACD3-50)
(IN)
ACD4-55 5.9 ACD Performance Monitoring
... ... ... ... ... ... ... ...
ACD4-56 The GEM will scale and telemeter count rates for ACD VETO and HLD signals, as well as various trigger primitives. ACD voltages and currents will be monitored by the AEM.
Test N/A ... ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
The ACD electronics shall collect and tr
(ACD3-52)
(IN)
ACD4-57 5.9.1 Low-Threshold Signal
... ... ... ... ... ... ... ...
ACD4-58 Requirement deleted.
... N/A ... N/A ... N/A ... ...
ACD4-59 5.9.2 Zero Supress Adjustability
... ... ... ... ... ... ... ...
ACD4-60 The zero suppress (PHA threshold) level shall be adjustable by channel. (This req was low threshold adjustability).

... FREE Comp Perf Test, ACD-Proc-000051

Chassis Full Functional Test ( ACD-PROC-000222 )

GAFE fucntional
... ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
(ACD4-60)
(OUT)
The zero suppress (PHA threshold) level
(ACD3-56)
(IN)
ACD4-61 5.9.3 Pulse Digitization (was Signal Content)
... ... ... ... ... ... ... ...
ACD4-62 When a TACK signal is received, the ACD electronics shall digitize all PMT signal amplitudes with the following precision:
    --for a pulse below 6.4 pC (10 MIP), precision of <0.0128 pC (0.02 MIP) or 5%, whichever is larger;
    --for a pulse above 6.4 pC (10 MIP), precision of <0.64 pC (1 MIP) or 2%, whichever is larger.

The largest signal amplitude to be digitized is at least 128 pC (200 MIP) goal of 640 pC (1000 MIP).

The ACD shall transmit to the AEM only digitized signals above the command-adjustable threshold for the specific channel (zero-suppress threshold).


Test Chassis Full Functional Test ( ACD-PROC-000222 ) Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)

Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
Upon a Level 1 Trigger Acknowledge (TACK
(ACD3-62)
(IN)
When a Level 1 Trigger Acknowledge (TACK
(ACD3-58)
(IN)
ACD4-66 5.9.4 Pulse Height Measurement Latency
... ... ... ... ... ... ... ...
ACD4-67 The PMT pulse amplitudes shall be digitized within 18.5 microseconds after a Level 1 trigger is received. (NOTE : Transmission to AEM not included in 18.5 microseconds, for example for the maximum data case, we put out 18 PHA words. This ends up taking ~ 29.5 or 30 usec of time for the PHA)
Test FREE Comp Perf Test, ACD-Proc-000051 Verified
FREE 0102, Chassis 4LA, WOA ACD-00022 Event 220 FREE 0103, Chassis 2RA, WOA ACD-00023 Event 220 FREE 0104, Chassis 2LA, WOA ACD-00024 Event 220 FREE 0106, Chassis 4RA, WOA ACD-00026 Event 220 FREE 1102, Chassis 1RB, WOA ACD-00028 Event 220 FREE 1103, Chassis 4LB, WOA ACD-00029 Event 220 FREE 1104, Chassis 3LA, WOA ACD-00030 Event 220 FREE 1105, Chassis 3RB, WOA ACD-00031 Event 220 FREE 1107, Chassis 2RB, WOA ACD-00033 Event 220 FREE 1108, Chassis 2LB, WOA ACD-00034 Event 220 FREE 1109, Chassis 4RB, WOA ACD-00035 Event 220 FREE 11010, Chassis 1LA, WOA ACD-00036 Event 220
Not directly verifiable at system level, see subsystem verification
Qualification See subassembly verification See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The pulse height measurements shall be c
(ACD3-64)
(IN)
ACD4-68 5.9.5 Integral Non-Linearity
... ... ... ... ... ... ... ...
ACD4-69 The integral non-linearity should be < 2% over the top 95% of the signal input range for the low-energe range (below 6.4 pC) for ease of analysis.
Test FREE Comp Perf Test, ACD-Proc-000051
GARC characterization section
Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)
- check with TCI regrange
Qualification, Acceptance ACD-INT-02318
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
When a Level 1 Trigger Acknowledge (TACK
(ACD3-58)
(IN)
The ACD electronics shall collect and tr
(ACD3-52)
(IN)
ACD4-70 5.9.6 Differential Non-Linearity
... ... ... ... ... ... ... ...
ACD4-71 Based on 1024 channels, the differential non-linearity shall be less than ±10% of the average channel width.
Test FREE Comp Perf Test, ACD-Proc-000051 Verified
FREE 0102, Chassis 4LA, WOA ACD-00022 Event 220 FREE 0103, Chassis 2RA, WOA ACD-00023 Event 220 FREE 0104, Chassis 2LA, WOA ACD-00024 Event 220 FREE 0106, Chassis 4RA, WOA ACD-00026 Event 220 FREE 1102, Chassis 1RB, WOA ACD-00028 Event 220 FREE 1103, Chassis 4LB, WOA ACD-00029 Event 220 FREE 1104, Chassis 3LA, WOA ACD-00030 Event 220 FREE 1105, Chassis 3RB, WOA ACD-00031 Event 220 FREE 1107, Chassis 2RB, WOA ACD-00033 Event 220 FREE 1108, Chassis 2LB, WOA ACD-00034 Event 220 FREE 1109, Chassis 4RB, WOA ACD-00035 Event 220 FREE 11010, Chassis 1LA, WOA ACD-00036 Event 220
Not directly verifiable at system level, see subsystem verification
Qualification See subassembly verification ... When a Level 1 Trigger Acknowledge (TACK
(ACD3-58)
(IN)
The ACD electronics shall collect and tr
(ACD3-52)
(IN)
ACD4-72 5.9.7 Temperature Stability
... ... ... ... ... ... ... ...
ACD4-73 The analog signal processing chain shall exhibit temperature stability of gain better than 500 ppm per degree C over the operating temperature range. For both the low range (0 to 6.4 pC ±20%, = 10 MIPs) and the high range (6.4 ±20% to 640 pC, 10 to 200 MIPs, the requirement is 200 MIPs but design goal is 1000 MIPs), the analog signal processing chain shall exhibit temperature stability of its baseline better than 0.05% of full scale per degree C.
Test FREE Comp Perf Test, ACD-Proc-000051
Probably over tested at one end but not sure if fully tested over full range at subassembly level, check this. ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)*

Meet for ACD as whole (averaged) but some channels fail indivdually, not a large issue but temp effect on performanc noted. Better at colder temps which is where ACD typical orbit is. SEE GLAST LAT ACD Performance Summary from Environmental Testing
ACD-RPT-000374

Qualification, Acceptance ACD-INT-02318 *
ACD-INT-02309 (MARGIN TEST) *

We meet the req for ACD as averaged over the channels but individual channels dotn meet this. Worst case channels can be up to 1% of full scale per deg C - SEE GLAST LAT ACD Performance Summary from Environmental Testing
ACD-RPT-000374
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
ACD-INT-02318
ACD-INT-02309 (MARGIN TES
(ACD4-79)
(OUT)
(ACD4-73)
(OUT)
The threshold for VETO detection of char (ACD3-18)(IN)
The average detection efficiency for min
(ACD3-20)
(IN)
When a Level 1 Trigger Acknowledge (TACK
(ACD3-58)
(IN)
The ACD electronics shall collect and tr
(ACD3-52)
(IN)
ACD4-74 5.9.8 Test Pulse Injection
... ... ... ... ... ... ... ...
ACD4-75 For test purposes, the ACD electronics shall incorporate the capability to be artificially stimulated by a test charge, via commands. The test charge injection range shall be 0 - 200 MIP with a goal of 0 - 1000 MIP.
Test, Simulation FREE Comp Perf Test, ACD-Proc-000051

GAFE Functional Test
... ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The ACD electronics shall collect and tr
(ACD3-52)
(IN)
ACD4-76 5.9.9 Digital Housekeeping
... ... ... ... ... ... ... ...
ACD4-77 The state of all ACD command registers shall be available for readout via GEM commands. The GEM will scale all ACD VETO and HLD rates and transmit the results in low rate telemetry.
Test FREE Comp Perf Test, ACD-Proc-000051
... ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
ACD shall make available other housekeep
(ACD3-66)
(IN)
ACD4-78 5.9.10 Temperature Monitoring
... ... ... ... ... ... ... ...
ACD4-79 ACD shall provide temperature transducer signals for survival, safe, and operational modes. Signals are specifically defined in ACD ICD. ACD does not provide the actual temperature monitoring.
Test Checked at full assembly level ... ACD CPT (ACD-PROC-000270).
Qualification, Acceptance ACD-INT-02318
ACD-INT-02334
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374

(ACD4-73)
(IN)
ACD shall make available other housekeep
(ACD3-66)
(IN)
ACD4-80 5.10 High Voltage Bias Supply
... ... ... ... ... ... ... ...
ACD4-81 5.10.1 HVBS Output Voltage Range
... ... ... ... ... ... ... ...
ACD4-82 The HVBS shall operate from +400 V to +1310 V.
Test HVBS Functional Test (ACD-PROC-000064)
Sec 4.4

Chassis Full Functional Test ( ACD-PROC-000222 )
Verified to 1300V
Chassis 1R, WOA ACD-01615 Event 70, Chassis 1L, WOA ACD-01616 Event 70 Chassis 3R, WOA ACD-01617 Event 70 , Chassis 3L, WOA ACD-01618 Event 70 Chassis 2R, WOA ACD-01622 Event 70 , Chassis 2L, WOA ACD-01623 Event 70 Chassis 4R, WOA ACD-01624 Event 70 , Chassis 4L, WOA ACD-01625 Event 70
ACD CPT (ACD-PROC-000270) up to 1000V which is above likley on orbit max value

ACD Margin Test (ACD-PROC-000352) up to 1000V
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)

up to 1000v, 1000-1300 done at subsystem level
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
The ACD shall meet the structural, ther
(ACD3-97)
(IN)
The ACD photomultiplier bias supplies sh
(ACD3-110)
(IN)
ACD4-83 5.10.2 HVBS Output Current
... ... ... ... ... ... ... ...
ACD4-84 The HVBS shall provide sufficient current to drive all PMTs (max 18) on each FREE circuit card at the maximum voltage (+1310V).
Test HVBS Functional Test (ACD-PROC-000064) Sec 4.5
Verified to 1300V

Chassis 1R, WOA ACD-01615 Event 70, Chassis 1L, WOA ACD-01616 Event 70 Chassis 3R, WOA ACD-01617 Event 70 , Chassis 3L, WOA ACD-01618 Event 70 Chassis 2R, WOA ACD-01622 Event 70 , Chassis 2L, WOA ACD-01623 Event 70 Chassis 4R, WOA ACD-01624 Event 70 , Chassis 4L, WOA ACD-01625 Event 70
ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270) up to 1000V which is above likely on orbit max value

ACD Margin Test (ACD-PROC-000352) up to 1000V

Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)

up to 1000V, 1000-1300 done at subsystem level
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The ACD shall detect energy deposits wit
(ACD3-16)
(IN)
ACD4-85 5.10.3 HVBS Limiting Output Current
... ... ... ... ... ... ... ...
ACD4-86 The HVBS output current shall be limited to protect the ACD from one PMT short. At maximum output voltage, each HVBS shall be capable of supplying a total output current of 60 mA. The nominal output current will be 36 mA.
Test HVBS Functional Test (ACD-PROC-000064) Sec 4.5
Verified

WOA's ACD-00321 to 00350
Not directly verifiable at system level, see subsystem verification
Qualification See subassembly verification ... The ACD total electronics power consumpt
(ACD3-91)
(IN)
No single failure in the ACD electronics
(ACD3-68)
(IN)
ACD4-87 5.10.4 HVBS Output Voltage Adjustment
... ... ... ... ... ... ... ...
ACD4-88 The HVBS output voltage shall be programmable with an analog input. The limiting output current of each HVBS shall be ~80 mA.
Test HVBS Functional Test (ACD-PROC-000064) Sec 4.5
Verified

WOA's ACD-00321 to 00350
Not directly verifiable at system level, see subsystem verification
)
Qualification See subassembly verification ... The threshold for VETO detection of char (ACD3-18)(IN)
The High-Threshold shall be adjustable f (ACD3-32)(IN)
The ACD electronics shall collect and tr
(ACD3-52)
(IN)
ACD4-89 5.10.5 HVBS Input Power
... ... ... ... ... ... ... ...
ACD4-90 Each HVBS shall operate from a supply voltage of 28V ± 2V (changed from +/-1v because LAT could not meet it), with possible input ripple of 10 mV (frequency range 50 Hz to 50 MHz). The noise shall be less than 100 mV RMS from DC to 1.0 MHz.
Test HVBS Functional Test (ACD-PROC-000064) Sec 4.5
Verified

WOA's ACD-00321 to 00350
Not directly verifiable at system level, see subsystem verification
)       
Qualification See subassembly verification ... 9.7.    Power    26
(ACDICD-45)
(IN)
ACD4-91 5.10.6 HVBS Line and Load Regulation
... ... ... ... ... ... ... ...
ACD4-92 The HVBS output voltage shall be regulated to ±0.5% for all combinations of input voltage and load current. (This produces ~5% change in PMT gain).
Test HVBS Functional Test (ACD-PROC-000064) Sec 4.5
Verified.

WOA's ACD-00321 to 00350
Not directly verifiable at system level, see subsystem verification
Qualification See subassembly verification ... The threshold for VETO detection of char (ACD3-18)(IN)
The average detection efficiency for min
(ACD3-20)
(IN)
ACD4-93 5.10.7 HVBS Output Ripple
... ... ... ... ... ... ... ...
ACD4-94 The HVBS output voltage ripple shall be compatible with the ACD ASIC design. The HVBS output voltage ripple shall not exceed ±2 mV p-p over the frequency range 100 Hz to 50 MHz
Test HVBS Functional Test (ACD-PROC-000064) Sec 4.8
Verified

WOA's ACD-00321 to 00350
Not directly verifiable at system level, see subsystem verification Qualification See subassembly verification ... The ACD shall detect energy deposits wit
(ACD3-16)
(IN)
ACD4-95 5.10.8 HVBS Power Consumption
... ... ... ... ... ... ... ...
ACD4-96 The HVBS power dissipation at maximum output voltage and limiting current shall be <300 mW.
Test HVBS Functional Test (ACD-PROC-000064) Sec 4.5
Verified if interpreted as per HVBS.

WOA's ACD-00321 to 00350
ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)) Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The ACD total electronics power consumpt
(ACD3-91)
(IN)
ACD4-97 5.10.9 HVBS Ramp Up/Down Time
... ... ... ... ... ... ... ...
ACD4-98 For either application or removal of input power, the time for the HVBS output voltage to reach its final level (for turn-on, within regulation tolerance) shall be between 5 and 30 seconds. Note: The 5 second requirement is driven by the PMT, the 30 seconds is driven by the maximum tolerable time for HVBS to stabilize when entering/exiting the SAA.
Test HVBS Functional Test (ACD-PROC-000064) Sec 4.7.1
Done, 3-14 sec measured, under 5 sec not much of an issue

WOA's ACD-00321 to 00350
Not directly verifiable at system level, see subsystem verification Qualification See subassembly verification ... The ACD shall meet the structural, ther
(ACD3-97)
(IN)
No single failure in the ACD electronics
(ACD3-68)
(IN)
ACD4-99 5.10.10 HVBS Temperature Stability
... ... ... ... ... ... ... ...
ACD4-100 The HVBS output voltage temperature stability shall be no worse than 500 ppm/C.
Test HVBS Functional Test (ACD-PROC-000064) Sec 4.9
Verified.

WOA's ACD-00928 to 00942
Not directly verifiable at system level, see subsystem verification Qualification See subassembly verification ... The average detection efficiency for min
(ACD3-20)
(IN)
ACD4-101 5.10.11 HVBS Output Voltage Monitoring
... ... ... ... ... ... ... ...
ACD4-102 The HVBS shall provide a linear output voltage monitor (for transmission to the AEM) in the range 0.0 to 2.5 V.
Test HVBS Functional Test (ACD-PROC-000064) Sec 4.5
Verified
WOA's ACD-00321 to 00350
ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
9.5.    Signal Description    23
(ACDICD-41)
(IN)
ACD shall make available other housekeep
(ACD3-66)
(IN)
ACD4-103 5.10.12 HVBS Ground Isolation
... ... ... ... ... ... ... ...
ACD4-104 The DC impedance between input and output grounds shall be 100 ohms ±20%.
Test Chassis Safe To Mate (ACD-PROC-000333) Verified
WOA's ACD-01615 to 01625
Chassis Safe To Mate (ACD-PROC-000333)
Qualification, Acceptance ACD-INT-02329
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
10.6.    Grounding and Shielding    34
(ACDICD-61)
(IN)
ACD4-105 5.10.13 HVBS Oscillator Frequency
... ... ... ... ... ... ... ...
ACD4-106 The HVBS shall utilize an oscillator frequency >100 kHz (to minimize EMI issues).
Test HVBS Functional Test (ACD-PROC-000064) Sec 4.4
Verified

WOA's ACD-00321 to 00350
Not directly verifiable at system level, see subsystem verification
Qualification See subassembly verification ... The ACD shall meet the structural, ther
(ACD3-97)
(IN)
ACD4-107 5.10.14 HVBS EMI and Susceptibility
... ... ... ... ... ... ... ...
ACD4-108 The HVBS shall neither generate nor be susceptible to electromagnetic interference exceeding the EMI/EMC test requirement, GSFC-433-RQMT-0005.
Analysis, Test EMI test procedure (ACD-PROC-000275) Verified.

WOA ACD-01742
EMI test plan (ACD-PLAN-000215)
Qualification See subassembly verification -Chassis EMI test WOA

See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The ACD shall meet the structural, ther
(ACD3-97)
(IN)
ACD4-109 5.11 PMT
... ... ... ... ... ... ... ...
ACD4-110 5.11.1 PMT Bias Chain Total Resistance
... ... ... ... ... ... ... ...
ACD4-111 The total resistance of a PMT bias chain shall be such as to result in a nominal current (at the maximum HVBS voltage) of 2 microamps (~100 times the PMT average anode current.)
Test Resistor Network Test Procedure (ACD-PROC-000065) Verified. Too many WOAs to list, one per PMT. Done by Daniels and Rock Not directly verifiable at system level, see subsystem verification
Qualification See subassembly verification ... The ACD shall detect energy deposits wit
(ACD3-16)
(IN)
The average detection efficiency for min
(ACD3-20)
(IN)
ACD4-112 5.11.2 PMT Bias Chain Filter Resistance
... ... ... ... ... ... ... ...
ACD4-113 At least four percent of the total resistance of the bias chain shall be in a filter resistor(s) at the high voltage input. This PMT bias chain filter resistance protects against a PMT short with a current limiting resistor and filters out HVBS ripple.
Analysis GLAST Resistor Network Board Schematic (ACD-DWG-2054543 Verified, & Rechecked by D.S. 11/5/04 N/A Development N/A ... The false VETO signal rate due to noise
(ACD3-28)
(IN)
No single failure in the ACD electronics
(ACD3-68)
(IN)
ACD4-114 5.11.3 PMT Bias Chain Resistor Distribution
... ... ... ... ... ... ... ...
ACD4-115 The number and values of the remaining resistors in the bias chain shall be selected to be compatible with the selected PMT, Hamamatsu R4443.
Analysis GLAST Resistor Network Board Schematic (ACD-DWG-2054543
Verified, & Rechecked by D.S. 11/5/04 N/A Development N/A ... The ACD shall detect energy deposits wit
(ACD3-16)
(IN)
ACD4-116 5.11.4 PMT Anode Signal Coupling
... ... ... ... ... ... ... ...
ACD4-117 The PMT anode signal shall be coupled into the associated analog electronics via two capacitors of 680 pF in series. A charge leakage bleed-off resistor of at least 1-mega ohms shall be incorporated on the low-voltage side of the capacitor pair.
Analysis GLAST Resistor Network Board Schematic (ACD-DWG-2054543
Verified, & Rechecked by D.S. 11/5/04. Capacitors C4 and C6, Res R14 N/A Development N/A ... The ACD shall detect energy deposits wit
(ACD3-16)
(IN)
ACD4-118 5.11.5 PMT Output Load Resistor
... ... ... ... ... ... ... ...
ACD4-119 A load resistor of > 10 KW shall terminate the bias network.
Analysis GLAST Resistor Network Board Schematic (GD2054543) Verified.

ACD-PROC-000203
N/A Development N/A ... The ACD shall detect energy deposits wit
(ACD3-16)
(IN)
ACD4-120 5.11.6 PMT Bias Chain Dynode Decoupling
... ... ... ... ... ... ... ...
ACD4-121 The resistors biasing the last three-dynode stages shall be bypassed by capacitors to prevent a drop in gain for very large pulses or the maximum expected high rate of pulses (<1% gain change for 3kHz rate).
Analysis GLAST Resistor Network Board Schematic (GD2054543) Verified, & Rechecked by D.S. 11/5/04. Cap C1,C2,C3 N/A Development N/A ... The ACD shall detect energy deposits wit
(ACD3-16)
(IN)
ACD4-122 5.12 Radiation Tolerance
... ... ... ... ... ... ... ...
ACD4-123 The ACD electronics shall remain within specifications after a total ionizing radiation dose of 4.5 kRad(Si).
Analysis, Test LAT-TD-05196, LAT-TD-05197, LAT-TD-05198, LAT-TD-05199, LAT-TD-05201 Done
Approved Parts List, LAT-TD-05196, LAT-TD-05197, LAT-TD-05198, LAT-TD-05199, LAT-TD-05201
Qualification See subassembly verification ... The ACD shall meet the structural, ther
(ACD3-97)
(IN)
ACD4-124 5.12.1 Single Event Upset Tolerance
... ... ... ... ... ... ... ...
ACD4-125 A single event upset (SEU) shall not cause the ACD electronics to transition to an unsafe state.
Analysis, Test TAMU SEU test procedure, LAT-TD-05191, LAT-TD-05192 Done

Approved Parts List, LAT-TD-05191, LAT-TD-05192
Qualification See subassembly verification ... No single failure in the ACD electronics
(ACD3-68)
(IN)
The ACD shall maintain the specified per
(ACD3-108)
(IN)
ACD4-126 5.12.2 Latchup Tolerance
... ... ... ... ... ... ... ...
ACD4-127 Parts that show any SEE’s at an LET lower than 37 MeV*cm2/mg shall not degrade the mission performance.
Analysis, Test TAMU SEU test procedure LAT-TD-05191, LAT-TD-05192, LAT-TD-03503
Done

Approved Parts List, LAT-TD-05191, LAT-TD-05192, LAT-TD-03503
Qualification See subassembly verification ... The ACD shall meet the structural, ther
(ACD3-97)
(IN)
No single failure in the ACD electronics
(ACD3-68)
(IN)
The ACD shall maintain the specified per
(ACD3-108)
(IN)
ACD4-128 5.13 Reliability
... ... ... ... ... ... ... ...
ACD4-863 The ACD shall meet the reliability allotment from LAT is currently .96 over 5 years.
Analysis, Simulation Tony DiVenti's Reliabity Report, Reliability Prediciton Assessments for the GLAST ACD.
LAT PRA - LAT-TD-02510-02
Failure modes effect analysis and critical items list report ACD-RPT-000042,
LAT Failure modes and effects analysis - LAT-TD-000374
Limited Life Analysis for ACD Report - ACD-RPT-000039
Done,
LAT PRA - LAT-TD-02510-02
Failure modes effect analysis and critical items list report ACD-RPT-000042,
LAT Failure modes and effects analysis - LAT-TD-000374
Limited Life Analysis for ACD Report - ACD-RPT-000039


Reliability Prediciton Assessments for the LAT PRA - LAT-TD-02510-02
Failure modes effect analysis and critical items list report ACD-RPT-000042,
LAT Failure modes and effects analysis - LAT-TD-000374
Limited Life Analysis for ACD Report - ACD-RPT-000039

Prediction is ~.97
Development, Acceptance N/A ... No single failure in the ACD electronics
(ACD3-68)
(IN)
ACD4-129 5.13.1 ACD Electronics Reliability
... ... ... ... ... ... ... ...
ACD4-130 No single failure in the ACD electronics shall result in complete loss of signal from more than one ACD detector (tile or ribbon). The overall calculated reliability of the ACD electronics assembly shall be at least 0.98 in one year.
Analysis, Simulation By design, Tony DiVenti's Reliabity Reports, LAT PRA - LAT-TD-02510-02
Failure modes effect analysis and critical items list report ACD-RPT-000042,
LAT Failure modes and effects analysis - LAT-TD-000374
Limited Life Analysis for ACD Report - ACD-RPT-000039
Done Reliability Prediciton Assessments for the GLAST ACD.
(LAT PRA - LAT-TD-02510-02
Failure modes effect analysis and critical items list report ACD-RPT-000042,
LAT Failure modes and effects analysis - LAT-TD-000374
Limited Life Analysis for ACD Report - ACD-RPT-000039
Development, Acceptance N/A ... No single failure in the ACD electronics
(ACD3-68)
(IN)
ACD4-131 5.13.2 ACD Tile Detector Assembly and Scintillator Ribbon Reliability
... ... ... ... ... ... ... ...
ACD4-132 The probability of the loss of both VETO signals from a specific scintillator tile shall be less than 1% in 5 years). The probability of the loss of VETO signals from a scintillator ribbon shall be less than 5% in 5 years. The overall calculated reliability of ACD scintillating tiles and scintillator ribbons shall be at least 0.99 in one year.
Analysis, Simulation Tony DiVenti's Reliabity Reports, LAT PRA - LAT-TD-02510-02
Failure modes effect analysis and critical items list report ACD-RPT-000042,
LAT Failure modes and effects analysis - LAT-TD-000374
Limited Life Analysis for ACD Report - ACD-RPT-000039
Done Reliability Prediciton LAT PRA - LAT-TD-02510-02
Failure modes effect analysis and critical items list report ACD-RPT-000042,
LAT Failure modes and effects analysis - LAT-TD-000374
Limited Life Analysis for ACD Report - ACD-RPT-000039
Development, Acceptance N/A ... No single failure in the ACD electronics
(ACD3-68)
(IN)
The loss of any one detector element (ti
(ACD3-70)
(IN)
The probability of the loss of both VETO
(ACD3-74)
(IN)
ACD4-133 5.13.3 Requirement moved to 5.12.2.
... ... ... ... ... ... ... ...
ACD4-134 5.13.4 Requirement moved to 5.12.1.
... ... ... ... ... ... ... ...
ACD4-135 5.13.5 ACD Micrometeoroid Shield/Thermal Blanket Reliability
... ... ... ... ... ... ... ...
ACD4-136 The overall calculated reliability of an ACD micrometeoroid shield/thermal blanket shall be at least 0.98 in one year. (see steve Ritz RFA response)
Analysis, Test, Simulation Johnson Shield Analysis - ACD MICROMETEOROID SHIELD PERFORMANCE ANALYSIS

ACD-RPT-000373
Done Johnson Shield Analysis
(ACD-RPT-000373), MMS/MLI spec (ACD-RQMT-000167), design details ACD-PLAN-000285)
Development N/A, Shot test ... No single failure in the ACD electronics
(ACD3-68)
(IN)
ACD4-137 5.13.6 Requirement combined with 5.13.2
... ... ... ... ... ... ... ...
ACD4-138 5.14 Commands
... ... ... ... ... ... ... ...
ACD4-139 5.14.1 Detector On/Off Commands
... ... ... ... ... ... ... ...
ACD4-140 The AEM and ACD will implement commands to allow each group of 18 PMT's to be powered on and off together.
Test GARC testing and FREE Comp Perf Test, ACD-Proc-000051 (high voltage enable/disable) Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)

Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site, and ACD perf report ACD-RPT-000374 http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/

10.3.    GARC Registers    31
(ACDICD-54)
(IN)
The ACD shall implement commands to allo
(ACD3-77)
(IN)
ACD4-141 5.14.2 Detector Gain Commands
... ... ... ... ... ... ... ...
ACD4-142 The ACD shall implement adjustability of the high voltage applied to the group of 18 PMT's associated with a single board.
Test GARC testing, FREE Comp Perf Test, ACD-Proc-000051 (high voltage DAC) Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The threshold for VETO detection of char (ACD3-18)(IN)
The High-Threshold shall be adjustable f (ACD3-32)(IN)
The ACD shall implement commands to allo
(ACD3-79)
(IN)
ACD4-143 5.14.3 Electronics On/Off Commands
... ... ... ... ... ... ... ...
ACD4-144 The AEM will implement commands to allow each ACD electronics board to be separately powered on and off.
Test Chassis Full Functional Test ( ACD-PROC-000222 ), LAT needs to verify Done at ACD level ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
9.7.    Power    26
(ACDICD-45)
(IN)
No single failure in the ACD electronics
(ACD3-68)
(IN)
The ACD shall implement commands to allo
(ACD3-81)
(IN)
ACD4-145 5.14.4 VETO Threshold Commands
... ... ... ... ... ... ... ...
ACD4-146 The ACD shall implement adjustability of the VETO threshold for each PMT.
Test FREE Comp Perf Test, ACD-Proc-000051 Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
(ACD4-28)
(IN)
The threshold for VETO detection of char (ACD3-18)(IN)
The High-Threshold shall be adjustable f (ACD3-32)(IN)
The ACD shall implement commands to set
(ACD3-83)
(IN)
ACD4-147 5.14.5 High-Threshold Commands
... ... ... ... ... ... ... ...
ACD4-148 The ACD shall implement adjustability of the High-Level Discriminator Threshold for each PMT.
Test FREE Comp Perf Test, ACD-Proc-000051 Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
(ACD4-35)
(IN)
The threshold for VETO detection of char (ACD3-18)(IN)
The High-Threshold shall be adjustable f (ACD3-32)(IN)
The ACD shall implement commands to set
(ACD3-85)
(IN)
ACD4-149 5.14.6 ACD Monitoring Commands
... ... ... ... ... ... ... ...
ACD4-150 The ACD shall implement adjustability of the monitoring functions of the ACD electronics, including test charge injection level.
Test FREE Comp Perf Test, ACD-Proc-000051 Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The ACD electronics shall collect and tr
(ACD3-52)
(IN)
The ACD shall implement commands to allo
(ACD3-87)
(IN)
ACD4-151 5.14.7 TACK Format
... ... ... ... ... ... ... ...
ACD4-152 TACK format shall be in compliance with ICD definition of TACK.
Test FREE Comp Perf Test, ACD-Proc-000051 Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
10.1.    AEM to ACD Command Format    27
(ACDICD-47)
(IN)
When a Level 1 Trigger Acknowledge (TACK
(ACD3-58)
(IN)
ACD4-153 5.14.8 Command Format
... ... ... ... ... ... ... ...
ACD4-154 Command formats shall be in compliance with ICD format definitions.
Test FREE Comp Perf Test, ACD-Proc-000051 Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
10.    ACD Command and Data Format    27
(ACDICD-46)
(IN)
ACD4-155 5.14.9 SAA Mode commands
... ... ... ... ... ... ... ...
ACD4-156 The ACD photomultiplier HVBSs shall switch into a low-gain mode to protect the phototubes in very high intensity particle conditions (> 10 kHz in an individual tile) such as the South Atlantic Anomaly. (Accomplished by HVBS command from AEM to GARC)
Test LAT must verify, FREE Comp Perf Test, ACD-Proc-000051 (use_saa_level) Done, must be verified at LAT also ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

Do it via ramping the HV up and then back down

ACD Margin Test (ACD-PROC-000352)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)

Must be done at LAT also
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The ACD photomultiplier bias supplies sh
(ACD3-110)
(IN)
The ACD shall implement commands to swit
(ACD3-89)
(IN)
ACD4-157 5.14.10 Notification of Mode Change
... ... ... ... ... ... ... ...
ACD4-158 The ACD shall identify times when it switches into low-gain mode for high counting rate conditions.
Test LAT must verify, FREE Comp Perf Test, ACD-Proc-000051 (use_saa_level)
Done, must be verified at LAT.
ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)
Qualification ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)


See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The ACD shall be able to tell (via volta
(ACD3-112)
(IN)
ACD4-159 5.15 Output Data Formats
... ... ... ... ... ... ... ...
ACD4-160 ACD Output data formats shall be in compliance with ICD format definitions.
Test Chassis Full Functional Test ( ACD-PROC-000222 ) Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
10.5.    ACD to AEM Data Format    33
(ACDICD-58)
(IN)
ACD4-161 5.16 Power Consumption
... ... ... ... ... ... ... ...
ACD4-162 The ACD total electronics power consumption shall not exceed orbital average of 10.5 W (11.5W now)conditioned. (reduced from 31 W in May/03, increased to 11.5W in May 05
Analysis, Test Chassis Full Functional Test ( ACD-PROC-000222 ) Done Not directly verifiable at ACD level
Qualification, Acceptance
LAT-XR-06636-01  Change Request.
ACD total power 11.34 W
The ACD total electronics power consumpt
(ACD3-91)
(IN)
ACD4-163 5.17 Total ACD Mass
... ... ... ... ... ... ... ...
ACD4-164 The total mass of the ACD shall not exceed 295 Kg. (see CR)
Analysis, Test CAD Model Mass Properties, Mass estimate table ... ACD-PROC-000195, ACD-PLAN-000152, 2072298s

Acceptance ACD-INT-02332 see ACD-INT-02332 The total mass of the ACD and micrometeo
(ACD3-93)
(IN)
ACD4-165 5.18 Environmental Requirements
... ... ... ... ... ... ... ...
ACD4-166 The ACD shall meet all structural, thermal, EM and radiation environment requirements. See LAT Environmental Specification, LAT-SS-00778
... See HVBS, FREE, PMT, Chassis, TSA, TDA Vibration and TVAC test plans. Radiation, see section 5.12
Done.  See test report Web site.
See ACD vibration, TVAC, EMI test plans. Radiation not verified at higher level. ACD Thermal Vacuum Procedure (ACD-PLAN-000347), ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270), EMI test plan (ACD-PLAN-000215), vib test plan (ACD-PLAN-000334), ACD-PLAN-000335 Qualification, Acceptance ACD-INT-02322,
ACD-INT-02334
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
The ACD shall meet the structural, ther
(ACD3-97)
(IN)
The thermal blanket/micrometeoroid shiel
(ACD3-104)
(IN)
ACD4-167 5.18.1 Ground - Handling and transportation Vibration and Shock
... ... ... ... ... ... ... ...
ACD4-168 Deleted in LAT level IIb 12/10/01, see ACD Transportation and Procedure (ACD-PLAN-000369) and ground env section of LAT Environmental Specification, LAT-SS-00778
Analysis n/a N/A n/a Development N/A ... The ACD shall meet the structural, ther
(ACD3-97)
(IN)
ACD4-169 5.18.2 Orbit - Flight temperature ranges
... ... ... ... ... ... ... ...
ACD4-856 ACD shall be able to handle orbit survival and operational temperature ranges specified in the ACD ICD (LAT-SS-363) and LAT Environmental Specification, LAT-SS-00778
Analysis, Test See HVBS, FREE, PMT, Chassis, TDA and TVAC test plans.
Done ACD Thermal Vacuum Procedure (ACD-PLAN-000347), ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)
Qualification, Acceptance ACD-INT-02334 See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
11.    Thermal Interface and Heat Transfer   
(ACDICD-65)
(IN)
The ACD shall meet the structural, ther
(ACD3-97)
(IN)
ACD4-185 5.18.3 Launch - Static Load
... ... ... ... ... ... ... ...
ACD4-186 ACD shall be capable of normal operation after exposure to launch loads as given LAT Environmental Specification, LAT-SS-00778 and in SI/SC IRD (sec 3)
Analysis, Test Structural analysis Encompased in TSA and chassis vibration test plans Done Structural Analysis, vib test

Vib test plan -ACD-PLAN-000334
Qualification, Acceptance ACD-INT-02322 ... The ACD shall meet the structural, ther
(ACD3-97)
(IN)
ACD4-187 5.18.4 Launch - Random Vibrations
... ... ... ... ... ... ... ...
ACD4-188 ACD shall be capable of normal operation after exposure to ASD
levels referred to in LAT Environmental Specification, LAT-SS-00778 ( previously referred to the SC IRD )
Analysis, Test See HVBS, FREE, PMT, Chassis, TSA, TDA Vibration. (ACD-PLAN -000111 and 000161)
Done Structural Analysis

ACD Vibration Test Plan ACD-PLAN-000334

(Electronics and Mechanical Random tests will be listed separetly in the above test plan, see Table 2 - Test Matrix for what assemblies and components see what accept and qual tests)
Qualification, Acceptance ACD-INT-02322 See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
The ACD shall meet the structural, ther
(ACD3-97)
(IN)
ACD4-189 5.18.5 Launch - Acoustic Loads
... ... ... ... ... ... ... ...
ACD4-190 Capable of normal operation after exposure to acoustic loads given in the LAT Environmental Specification, LAT-SS-00778 (this used to refer to SI/SC IRD which refers to spec 433-SPEC-0003), the acoustic equivalant design loads are derived in LAT-SS-00778 (ACD previously refered to ACD SPEC-3006). (Note : information on acoustic abatement at the GLAST launch pad and preliminary acoustic loads analyses for ACD have reduced acoustic loads)
Analysis, Test Analysis, ACD-PLAN-000196 mech subassembly acoustic test plan -ACD-PLAN-000196 Structural Analysis

ACD Acoutics Test Plan (ACD-PLAN-000335)
Qualification, Acceptance ACD-INT-02334 See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
The ACD shall meet the structural, ther
(ACD3-97)
(IN)
ACD4-191 5.18.6 Launch - Shock
... ... ... ... ... ... ... ...
ACD4-192 Capable of normal operation after exposure to external shock levels given in LAT Environmental Specification, LAT-SS-00778, as applicable, attenuated to SI/SC interface values.
Analysis Shock Analysis
ACD-DOC-000388
Done Structural Analysis Development N/A ... The center of mass of the ACD and microm
(ACD3-95)
(IN)
ACD4-193 5.18.7 Launch - temperature
... ... ... ... ... ... ... ...
ACD4-194 Tolerate 0 to 30 °C in launch configuration
Analysis Analysis Done Thermal Analysis

Structural Analyisis (tile gap contact report)
Development N/A
The ACD shall meet the structural, ther
(ACD3-97)
(IN)
ACD4-195 5.18.8 Launch - Pressure (See LAT Env Spec, LAT-SS-00778)
... ... ... ... ... ... ... ...
ACD4-196 5.18.9 Part 1 On-orbit - Thermal
... ... ... ... ... ... ... ...
ACD4-197 Flux Env - Tolerate Earth IR loads of 265 W/m^2 (hot case), and 208 W/m^2 (cold case), plus Earth Albedo factor of 0.40 (hot case), and 0.25 (cold case) . See LAT Environmental Specification, LAT-SS-00778 and the LAT Thermal Design Parameters Study LAT-TD-00224.
Analysis Thermal analysis (in CDR presentation) Done Thermal Vacuum Test Plan
ACD-PLAN-000347
Development ACD-INT-02334 indirectly Check vs ICD numbers or link to ICD 11.    Thermal Interface and Heat Transfer   
(ACDICD-65)
(IN)
ACD4-198 Environment
... ... ... ... ... ... ... ...
ACD4-199 Solar Flux - 1419 W/m^2 (hot case), and 1286 W/m^2 (cold case), sustained exposure on +X side. See LAT Environmental Specification, LAT-SS-00778 and the LAT Thermal Design Parameters Study LAT-TD-00224.
Analysis Thermal analysis (in CDR presentation) Done Thermal Vacuum Test Plan
ACD-PLAN-000347
Development ACD-INT-02334 indirectly Check vs ICD numbers or link to ICD 11.    Thermal Interface and Heat Transfer   
(ACDICD-65)
(IN)
ACD4-200 5.18.9 Part 2 On-orbit - Thermal general
... ... ... ... ... ... ... ...
ACD4-857 Handle orbit interface, survival and operational thermal values specifed in ICD.
Analysis, Test Thermal anslysis, Chassis, TDA, thermal vac test plan Done ACD Thermal Vacuum Procedure (ACD-PLAN-000347), ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270) Qualification, Acceptance ACD-INT-02334 See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
11.    Thermal Interface and Heat Transfer   
(ACDICD-65)
(IN)
The thermal blanket/micrometeoroid shiel
(ACD3-106)
(IN)
The ACD shall meet the structural, ther
(ACD3-97)
(IN)
ACD4-202 5.18.10 On-Orbit Charged Particle Radiation
... ... ... ... ... ... ... ...
ACD4-203 Deleted from LAT IIb
... ... ... ... ... ... ... ...
ACD4-204 5.18.11 On-Orbit - Meteoroid and Debris Flux
... ... ... ... ... ... ... ...
ACD4-205 Instrument must withstand meteoroid and debris flux estimates given in GLAST MSS Section 'Micrometeoroid and Debirs Flux'
Analysis, Test Johnson Shield Analysis - ACD MICROMETEOROID SHIELD PERFORMANCE ANALYSIS

ACD-RPT-000373

Done, Also test shot done on engineering unit sample Johnson Shield Analysis - ACD MICROMETEOROID SHIELD PERFORMANCE ANALYSIS

ACD-RPT-000373

Development N/A ... The thermal blanket/micrometeoroid shiel
(ACD3-104)
(IN)
ACD4-206 5.19 Performance Life
... ... ... ... ... ... ... ...
ACD4-207 The ACD shall maintain the specified performance for a minimum of five years in orbit except in the case of one tile failure .
Analysis Reliability Prediciton LAT PRA - LAT-TD-02510-02
Failure modes effect analysis and critical items list report ACD-RPT-000042,
LAT Failure modes and effects analysis - LAT-TD-000374
Limited Life Analysis for ACD Report - ACD-RPT-000039
Done Reliability Prediciton LAT PRA - LAT-TD-02510-02
Failure modes effect analysis and critical items list report ACD-RPT-000042,
LAT Failure modes and effects analysis - LAT-TD-000374
Limited Life Analysis for ACD Report - ACD-RPT-000039
Development, Acceptance N/A ... The ACD shall maintain the specified per
(ACD3-108)
(IN)
ACD4-208 5.20 Rate Requirement for Operation within Specification
... ... ... ... ... ... ... ...
ACD4-209 Each ACD PMT and its associated electronics shall be capable of operating within the specifications above at MIP rates up to 3 kHz. (The 3kHz per tile is just above the high count rate.)
Test Some tested wth light leaks G3 does not allow us to test this , only tested at subsytem level with the few that have seen light leaks during test ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270) via the ribbon PMTs which all run higher than 3kHz. Other channels of same design verified via similairty but will never need to run that high.
( light leak test only other way)
Qualification, Acceptance ACD-INT-02318 via ribbon channels ... Each ACD PMT and its associated electron
(ACD3-114)
(IN)
ACD4-210 5.21 Testability
... ... ... ... ... ... ... ...
ACD4-211 The ACD electronics shall incorporate additional capabilities as needed to enable thorough and efficient testing, throughout the GLAST mission, of the functions required of the ACD.
Inspection, Test General design, various tests like FREE CPT, ACD CPT Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270) Qualification, Acceptance ACD-INT-02318 ACD-INT-02309 (MARGIN TEST)   
ACD-INT-02318   
ACD-INT-02322   
ACD-INT-02322   
ACD-INT-02334   
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
No single failure in the ACD electronics
(ACD3-68)
(IN)
ACD shall be testable to confirm perform
(ACD3-72)
(IN)
ACD4-212 5.22 Center of Mass
... ... ... ... ... ... ... ...
ACD4-213 The ACD center of mass shall be X=Y<10 mm and Z<330 mm from the C.S. (was 393, current estimate is 318mm) as listed in the ACD-LAT ICD (LAT-SS-00363)
Analysis, Test n/a ... ACD-PLAN-000152, ACD-PROC-000195

CAD Model Mass Properties
Development,
Acceptance
ACD-INT-02331 see ACD-INT-02331 6.1.    General Description    12
(ACDICD-11)
(IN)
The center of mass of the ACD and microm
(ACD3-95)
(IN)
ACD4-214 5.23 Volume
... ... ... ... ... ... ... ...
ACD4-215 As shown in the ACD IDD (Interface Definition Drawings) (LAT-DS-00309), (also refer to LAT-DS 00040 & 00038), the ACD volume shall be:
Analysis, Inspection n/a ... ACD survey Plan, LAT-DS-000309, ACD-PLAN-000285 Development, Acceptance ACD-INT-02207 see ACD-INT-02207
ACD Survey Report, ACD-RPT-000387
The dimensions of the ACD plus the micro
(ACD3-99)
(IN)
ACD4-216 Inside LAT Grid: 1574 x 1574 x -204.7 mm
... ... ... ACD survey Plan, LAT-DS-000309, ACD-PLAN-000285 Development, Acceptance ACD-INT-02207 ACD Survey Report, ACD-RPT-000387 ...
ACD4-217 Inside LAT Tracker: 1515.5 x 1515.5 x 650 mm
... ... ... ACD survey Plan, LAT-DS-000309, ACD-PLAN-000285 Development, Acceptance ACD-INT-02207 ACD Survey Report, ACD-RPT-000387. ...
ACD4-218 Outside: 1820 x 1820 x 1050 mm
 LAT ACD Interface Definition Drawings LAT-DS-00309-04.
The previous outside volume was
1806x1806x1050 and before that 1796 x 1796 x 1015 mm.
... CAD model
... ACD survey Plan, LAT-DS-000309, ACD-PLAN-000285 Development, Acceptance ACD-INT-02207
CR submitted for soft stay-clear nonconformances
ACD Survey Report, ACD-RPT-000387 ...
ACD4-219 5.24 Instrument Coverage
... ... ... ... ... ... ... ...
ACD4-220 The ACD TDAs shall cover the top and sides of the LAT tracker down to 2 cm below the lowest SSD in the tracker and to within 2 mm of the top of the CsI in the calorimeter, with a goal to cover to the the top of the CsI in the calorimeter. See ACD IDD (Interface Definition Drawings) (LAT-DS-00309).
Analysis, Inspection CAD model at LAT Done at ACD level.
CAD model, verifible only by LAT. Agreed to by D. Horn Development Verifed at LAT although we just noticed a dimension we probably dont meet the tolerances for in a late ICD change. CR submitted.
... The ACD shall cover the top and sides of
(ACD3-22)
(IN)
ACD4-221 5.25 LAT to ACD Gap.
...
... CAD model at LAT
... ... ... ...
ACD4-222 The minimum ACD distance from the LAT Trackers shall be as defined in ACD IDD (Interface Definition Drawings) (LAT-DS-00309).
Analysis CAD model at LAT

Verified at LAT CAD model Development, Acceptance Verifed at LAT , inner survey succesful which veries dimension assuming LAT CAD models correct See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
, and ACD perf report ACD-RPT-000374
The ACD shall cover the top and sides of
(ACD3-22)
(IN)
ACD4-223 5.26 Material interaction of gamma radiation (Gamma radiation due to ACD material interactions)
... ... ... ... ... ... ... ...
ACD4-224 The ACD shall cause interaction of less than 6% of the incident gamma radiation.
Analysis n/a ...
Development N/A ACD-RPT-000395, GLAST LAT ACD As-Built Gamma-Ray Absorption
(ACD4-226)
(OUT)
The thermal blanket/micrometeoroid shiel
(ACD3-102)
(IN)
The ACD, support structure, and micromet
(ACD3-24)
(IN)
ACD4-225 5.27 Thermal Blanket/ Micrometeoroid Shield Areal Mass Density
... ... ... ... ... ... ... ...
ACD4-226 The thermal blanket/micrometeoroid shield shall have mass per unit area of ~ <0.32 g/cm2 which should minimize secondary gamma-ray production by undetected cosmic ray interactions.
Analysis MMS/MLI spec (ACD-RQMT-000167), ... By design, MMS/MLI spec (ACD-RQMT-000167), details ACD-PLAN-000285), ACD-PROC-000356, ACDPLAN-000152, 2054591, 2054500, 2072262, 2054592 Qualification, Acceptance ACD-INT- 2317, 2157, 2326
Actual measured value 0.38 g/cm2
See WOAs

ACD-RPT-000394,

GLAST LAT ACD As-Built Area Density of the ACD MMS/MLI

N/A
(ACD4-224)
(IN)
The thermal blanket/micrometeoroid shiel
(ACD3-102)
(IN)
ACD4-227 5.28 Gaps between scintillating tiles
... ... ... ... ... ... ... ...
ACD4-228 The gaps between scintillating tiles shall be small enough over the operating temperature range to meet the ACD efficiency requirement. See tile gap analysis trade study, for latest simulation results available, which set gaps assumptions, see Alex Moiseev.
Analysis, Inspection, Simulation n/a N/A TSA dwg

As built gap table

Thermal Analysis

Structural Analysis

Acoustical Analysis

Post Tile Integration Inspection
Acceptance ACD-INT- 1626, 2122, 2065. Also see final GAP report, ACD-RPT-000389
Performance Validation and Calibration, ACD-RPT-000372 The average detection efficiency for min
(ACD3-20)
(IN)
ACD4-229 5.29 Light Throughput
... ... ... ... ... ... ... ...
ACD4-230 The amount of light transmitted from the scintillating tiles to the PMT shall be sufficient to provide required overall ACD efficiency of 0.9997.
Test, Simulation Fiber cable light throughput tests Done ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)

ACD Margin Test (ACD-PROC-000352)

Also SEE GLAST LAT ACD Performance Summary from Environmental Testing
ACD-RPT-000374
Qualification, Acceptance ACD-INT-02318
ACD-INT-02309 (MARGIN TEST)
Also SEE GLAST LAT ACD Performance Summary from Environmental Testing
ACD-RPT-000374
ACD perf report ACD-RPT-000374, and ACD-RPT-000372. Also see ACD test report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
The average detection efficiency for min
(ACD3-20)
(IN)
ACD4-845 6 VERIFICATION STRATEGY
... ... ... ... ... ... ... ...
ACD4-846 The verification strategy will test, analyze (may include modeling/simulation), inspect, or demonstrate all requirements of section 5 to ensure that the instrument meets the requirements of this specification. The matrix below indicates the methods of verification employed to verify the science performance.
... ... ... ... ... ... ... ...

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