ID | LAT ACD Subsystem Level IV Requirements and Verification Table, LAT-SS-00352 | Verification Method | Component/Subassembly Verification (if any) Procedure & hardware | Component/Subassembly Verification (if any) Status | ACD System Verification Procedure | ACD System Verification Stage/Status | Work Order Auth. (WOA) | Test Report if seperate from WOA | Links |
---|---|---|---|---|---|---|---|---|---|
ACD4-1 | LAT-SS-00352-01-D10 |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-2 | Gamma-ray Large Area Space
Telescope |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-3 | (GLAST) |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-4 | Large Area Telescope (LAT) |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-5 | Anticoincidence Detector (ACD) |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-6 | Subsystem Level 4
Requirements/Specification |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-7 | 1 PURPOSE |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-8 | 2 SCOPE |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-9 | 3 DEFINITIONS |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-10 | 4 APPLICABLE DOCUMENTS |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-11 | 5 REQUIREMENTS |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-12 | 5.1 System Information |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-20 | Science signals from the TDA's
and their associated PMT's are defined in terms of MIP's, the signal
generated by a minimum-ionizing singly-charged particle traversing a
tile in a direction normal to its surface. To provide a meaningful
electronics specification, the definition of a MIP must be normalized
to the electrical charge delivered by each of the two PMT's in response
to a MIP. The following parameters are assumed for the MIP calculation: |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-21 | 10 photoelectrons per PMT per MIP |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-22 | PMT gain of 400,000 |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-23 | The result is that 1 MIP
produces a PMT anode signal of 0.64 pC. |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-24 | In the requirements shown below,
allowance has been made (and noted) for differential degradation of the
PMT's within a board. This effect forces a broadening of the range of
adjustability of the discriminators in sections 5.3, 5.6, and 5.9.2. |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-25 | 5.2 Charged Particle Detection |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-26 | The ACD shall produce both fast
and logic (hitmap) VETO signals in response to PMT signals resulting
from charged particles traversing the ACD tiles and ribbons. |
Test | N/A | N/A | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
The
ACD shall detect energy deposits wit (ACD3-16)(IN) |
ACD4-27 | 5.3 Adjustable Threshold on
VETO Detection of Charged Particles |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-28 | The threshold for detecting
charged particles shall be adjustable from 0.064 to 1.28 pC (0.1 to 2
MIP), with a step size of <0.032 pC (0.05 MIP). |
Test | FREE Comp Perf Test, ACD-Proc-000051. Section 11.16 (Also checked in GAFE chip testing) |
Completed succesfully | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) Chassis Full Functional Test ( ACD-PROC-000222 ) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site, http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) (ACD4-146)(OUT) The threshold for VETO detection of char (ACD3-18)(IN) |
ACD4-29 | 5.4 False VETO due to
Electrical Noise |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-30 | The total ACD false VETO trigger
rate due to noise shall be less than 10 kHz (~46Hz per channel) at
0.096 pC (0.15 MIP) threshold (assuming 1 us VETO pulses). |
Analysis, Test, Simulation | Elect Int Test , ACD-PROC-000164), Sec 5.2, 5.3 | Done. Hard to measure once TDAs are attached. |
ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
The
false VETO signal rate due to noise (ACD3-28)(IN) |
ACD4-31 | 5.5 High-Threshold Detection |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-32 | The ACD shall detect pulses due
to highly-ionizing particles (carbon-nitrogen-oxygen or heavier
nuclei), which produce signals from 31.2 - 200 MIP (20 pC to 128 pC)
with a goal of 1000 MIP (640 pC). The ACD is required to detect, via
the High-Level Discriminator (HLD), all signals above the High-Level
threshold (nominally 25 MIP's); it is required to digitize (PHA)
signals up to 200 MIP's (128 pC). The current design actually allows
for digitization of signals up to 1000 MIP's (640 pC). Each ACD electronics board shall OR up to 18 HLD outputs (selected via command) to generate a single HLD_OR signal for transmission to the AEM. |
Test, Simulation | FREE Comp Perf Test, ACD-Proc-000051. Section 11.16 (TCI) Chassis Full Functional Test ( ACD-PROC-000222 ) |
Done Done |
ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) up to ~200 MIP ACD Margin Test (ACD-PROC-000352) FREE Functional Test ( ACD-PROC-000051 ) from 200 to 1000 MIP, no req to fully test above 200 MIP. |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
The
ACD shall detect highly-ionizing par (ACD3-30)(IN) |
ACD4-34 | 5.6 Adjustable High-Threshold |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-35 | The High-Level Threshold shall be
adjustable for PMT signals from 12.8 to 40.96 pC (20 to 64 MIP) in
steps of 0.64 pC (1 MIP) ±20%. HOWEVER As
of Oct 2003 the GAFE 5G and GAFE 7, one of which should be our flight
chip, do not quite meet this requirement as stated. On those chips
The High Level Discriminator is adjustable from 0 - 130 MIP in steps
less than 1.6 MIP/step. This adjustablility still allows us to meet all
of our related requirements. So this is likely to be our flight
performance. See related NCR |
Test | FREE Comp Perf Test, ACD-Proc-000051. Chassis Full Functional Test ( ACD-PROC-000222 ) |
Done Done |
ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) FREE Functional Test ( ACD-PROC-000051 ) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) (ACD4-148)(OUT) The High-Threshold shall be adjustable f (ACD3-32)(IN) |
ACD4-36 | 5.7 Level 1 Trigger
Acknowledge (TACK) |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-37 | The ACD electronics shall accept
from the GEM a Level 1 Trigger Acknowledge signal and respond by
digitizing and latching data. |
Test | FREE Comp Perf Test, ACD-Proc-000051. Section 11.16 Chassis Full Functional Test ( ACD-PROC-000222 ) |
Done Done |
ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
10.
ACD Command and Data Format 27 (ACDICD-46)(IN) |
ACD4-38 | 5.8 Signals |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-39 | 5.8.1 Fast VETO (VETO_AEM)
Signal Latency |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-40 | The fast VETO signal latency
shall be 100<tlatent<600 nsec from the time of particle passage.
The time jitter in the VETO pulses shall be <200 ns relative to
particle passage. (‘Deglitch’ circuit raised min latency to 100 nsec
from 50 nsec). |
Test | FREE Comp Perf Test, ACD-Proc-000051. Section 11 |
Verified FREE 0102, Chassis 4LA, WOA ACD-00022 Event 220 FREE 0103, Chassis 2RA, WOA ACD-00023 Event 220 FREE 0104, Chassis 2LA, WOA ACD-00024 Event 220 FREE 0106, Chassis 4RA, WOA ACD-00026 Event 220 FREE 1102, Chassis 1RB, WOA ACD-00028 Event 220 FREE 1103, Chassis 4LB, WOA ACD-00029 Event 220 FREE 1104, Chassis 3LA, WOA ACD-00030 Event 220 FREE 1105, Chassis 3RB, WOA ACD-00031 Event 220 FREE 1107, Chassis 2RB, WOA ACD-00033 Event 220 FREE 1108, Chassis 2LB, WOA ACD-00034 Event 220 FREE 1109, Chassis 4RB, WOA ACD-00035 Event 220 FREE 11010, Chassis 1LA, WOA ACD-00036 Event 220 |
Not directly verifiable at system level, see subsystem verification | Qualification | See subassembly verification | See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
ACD-INT-02318 (ACD4-50)(OUT) For each PMT, a fast VETO signal shall b (ACD3-34)(IN) The fast VETO signal latency shall be co (ACD3-36)(IN) |
ACD4-41 | 5.8.2 Fast VETO (VETO_AEM)
Signal Width |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-42 | The fast VETO output signal shall
have a commandable width of 50 - 400 nsec, after ‘de-glitching’ on 2
successive clock pulses. The leading and trailing edges must be
synchronous with clock pulses. |
Test | FREE Comp Perf Test, ACD-Proc-000051. Section 11.5 |
Verified FREE 0102, Chassis 4LA, WOA ACD-00022 Event 220 FREE 0103, Chassis 2RA, WOA ACD-00023 Event 220 FREE 0104, Chassis 2LA, WOA ACD-00024 Event 220 FREE 0106, Chassis 4RA, WOA ACD-00026 Event 220 FREE 1102, Chassis 1RB, WOA ACD-00028 Event 220 FREE 1103, Chassis 4LB, WOA ACD-00029 Event 220 FREE 1104, Chassis 3LA, WOA ACD-00030 Event 220 FREE 1105, Chassis 3RB, WOA ACD-00031 Event 220 FREE 1107, Chassis 2RB, WOA ACD-00033 Event 220 FREE 1108, Chassis 2LB, WOA ACD-00034 Event 220 FREE 1109, Chassis 4RB, WOA ACD-00035 Event 220 FREE 11010, Chassis 1LA, WOA ACD-00036 Event 220 |
Not directly verifiable at system level, see subsystem verification | Qualification | See subassembly verification | See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
fast VETO output signal shall have a (ACD3-44)(IN) The dead time shall be less than 1 msec (ACD3-430)(IN) For a signal equivalent to 200 MIP's, th (ACD3-46)(IN) |
ACD4-43 | 5.8.3 Fast VETO (VETO_AEM)
Retriggering |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-44 | After a Fast VETO discriminator
pulse, the time during which the discriminator cannot be retriggered shall be no more than 50 ns. |
Test | FREE Functional Test ( ACD-PROC-000051 ) | Verified FREE 0102, Chassis 4LA, WOA ACD-00022 Event 220 FREE 0103, Chassis 2RA, WOA ACD-00023 Event 220 FREE 0104, Chassis 2LA, WOA ACD-00024 Event 220 FREE 0106, Chassis 4RA, WOA ACD-00026 Event 220 FREE 1102, Chassis 1RB, WOA ACD-00028 Event 220 FREE 1103, Chassis 4LB, WOA ACD-00029 Event 220 FREE 1104, Chassis 3LA, WOA ACD-00030 Event 220 FREE 1105, Chassis 3RB, WOA ACD-00031 Event 220 FREE 1107, Chassis 2RB, WOA ACD-00033 Event 220 FREE 1108, Chassis 2LB, WOA ACD-00034 Event 220 FREE 1109, Chassis 4RB, WOA ACD-00035 Event 220 FREE 11010, Chassis 1LA, WOA ACD-00036 Event 220 |
Not directly verifiable at system level, see
subsystem verification |
Qualification | N/A | Check ACD Test report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
average detection efficiency for min (ACD3-20)(IN) |
ACD4-45 | 5.8.4 Logic VETO
(VETO_Hitmap) Signal |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-46 | A map of VETO signals shall be
generated for each TACK, indicating which ACD PMT's produced signals
above their thresholds within ~200 ns of the time of the event causing
the TACK. (Note: The ~200 ns window is required because of time jitter
in the TACK signal). |
Test | FREE Comp Perf Test, ACD-Proc-000051. Section 11.7 |
Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) Hitmap Syncronization ) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
dead time shall be less than 1 msec (ACD3-430)(IN) A map of the tiles that produce VETO sig (ACD3-38)(IN) The logic VETO map shall represent the s (ACD3-42)(IN) |
ACD4-47 | 5.8.5 Logic VETO
(VETO_Hitmap) Signal Latency |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-48 | In response to a TACK, the map of
VETO signals shall be latched by the time the ADC conversions are
complete. |
Test | FREE Comp Perf Test, ACD-Proc-000051. Section 11.7 |
Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) Chassis Full Functional Test ( ACD-PROC-000222 ) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
map of VETO signals shall be latched (ACD3-40)(IN) |
ACD4-49 | 5.8.6 High-Threshold Signal
Latency |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-50 | A highly-ionizing particle
hitting the top or upper side row of tiles of the ACD shall produce a
High-Threshold fast signal that will be delivered to the AEM with
latency of no more than that the latency as defined for the fast VETO
in specification 5.8.1. Command-selected signals out of the eighteen
(18) High-Threshold fast signals generated on a single electronics
board shall be OR'ed to produce a single signal for transmission to the
AEM. |
Test | FREE Comp Perf Test, ACD-Proc-000051 | Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) with TCI ACD Margin Test (ACD-PROC-000352) with TCI Chassis Full Functional Test ( ACD-PROC-000222 ) (measured at ACD level with TCI) |
Qualification, Acceptance | ACD-INT-02318 (with TCI) ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The fast VETO
signal latency shall be 10 (ACD4-40)(IN) A highly-ionizing particle hitting the t (ACD3-48)(IN) |
ACD4-51 | 5.8.7 Discriminator Masking |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-52 | Each ACD electronics board shall
have the capability to disable any combination of the Fast VETO and HLD
discriminator outputs. This is to mask unused HLD signals, unpopulated
veto channels, and signals due to channel failure. |
Test | FREE Comp Perf Test, ACD-Proc-000051 |
Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) (ACD4-52)(OUT) The ACD shall detect highly-ionizing par (ACD3-30)(IN) |
ACD4-53 | 5.8.8 ACD Trigger Primitives |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-54 | This requirement deleted for ACD.
The ACD will produce no trigger primitives internally. The VETO signals
caused by the individual PMT's will be transmitted to the GEM, where
they will be OR'ed together (for each tile or ribbon), and used by the
GEM to generate trigger primitives. |
... | N/A | ... | N/A | ... | N/A | ... | The
ACD will produce no trigger primitiv (ACD3-50)(IN) |
ACD4-55 | 5.9 ACD Performance Monitoring |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-56 | The GEM will scale and telemeter
count rates for ACD VETO and HLD signals, as well as various trigger
primitives. ACD voltages and currents will be monitored by the AEM. |
Test | N/A | ... | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
The
ACD electronics shall collect and tr (ACD3-52)(IN) |
ACD4-57 | 5.9.1 Low-Threshold Signal |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-58 | Requirement deleted. |
... | N/A | ... | N/A | ... | N/A | ... | ... |
ACD4-59 | 5.9.2 Zero Supress
Adjustability |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-60 | The zero suppress (PHA threshold)
level shall be adjustable by channel. (This req was low threshold
adjustability). |
... | FREE Comp Perf Test, ACD-Proc-000051 Chassis Full Functional Test ( ACD-PROC-000222 ) GAFE fucntional |
... | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) (ACD4-60)(OUT) The zero suppress (PHA threshold) level (ACD3-56)(IN) |
ACD4-61 | 5.9.3 Pulse Digitization (was
Signal Content) |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-62 | When a TACK signal is received,
the ACD electronics shall digitize all PMT signal amplitudes with the
following precision: --for a pulse below 6.4 pC (10 MIP), precision of <0.0128 pC (0.02 MIP) or 5%, whichever is larger; --for a pulse above 6.4 pC (10 MIP), precision of <0.64 pC (1 MIP) or 2%, whichever is larger. The largest signal amplitude to be digitized is at least 128 pC (200 MIP) goal of 640 pC (1000 MIP). The ACD shall transmit to the AEM only digitized signals above the command-adjustable threshold for the specific channel (zero-suppress threshold). |
Test | Chassis Full Functional Test ( ACD-PROC-000222 ) | Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
Upon
a Level 1 Trigger Acknowledge (TACK (ACD3-62)(IN) When a Level 1 Trigger Acknowledge (TACK (ACD3-58)(IN) |
ACD4-66 | 5.9.4 Pulse Height
Measurement Latency |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-67 | The PMT pulse amplitudes shall be
digitized within 18.5 microseconds after a Level 1 trigger is received.
(NOTE : Transmission to AEM not included in 18.5 microseconds, for
example for the maximum data case, we put out 18 PHA words. This ends
up taking ~ 29.5 or 30 usec of time for the PHA) |
Test | FREE Comp Perf Test, ACD-Proc-000051 | Verified FREE 0102, Chassis 4LA, WOA ACD-00022 Event 220 FREE 0103, Chassis 2RA, WOA ACD-00023 Event 220 FREE 0104, Chassis 2LA, WOA ACD-00024 Event 220 FREE 0106, Chassis 4RA, WOA ACD-00026 Event 220 FREE 1102, Chassis 1RB, WOA ACD-00028 Event 220 FREE 1103, Chassis 4LB, WOA ACD-00029 Event 220 FREE 1104, Chassis 3LA, WOA ACD-00030 Event 220 FREE 1105, Chassis 3RB, WOA ACD-00031 Event 220 FREE 1107, Chassis 2RB, WOA ACD-00033 Event 220 FREE 1108, Chassis 2LB, WOA ACD-00034 Event 220 FREE 1109, Chassis 4RB, WOA ACD-00035 Event 220 FREE 11010, Chassis 1LA, WOA ACD-00036 Event 220 |
Not directly verifiable at system level, see
subsystem verification |
Qualification | See subassembly verification | See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
pulse height measurements shall be c (ACD3-64)(IN) |
ACD4-68 | 5.9.5 Integral Non-Linearity |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-69 | The integral non-linearity should
be < 2% over the top 95% of the signal input range for the
low-energe range (below 6.4 pC) for ease of analysis. |
Test | FREE Comp Perf Test, ACD-Proc-000051 GARC characterization section |
Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) - check with TCI regrange |
Qualification, Acceptance | ACD-INT-02318 |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
When
a Level 1 Trigger Acknowledge (TACK (ACD3-58)(IN) The ACD electronics shall collect and tr (ACD3-52)(IN) |
ACD4-70 | 5.9.6 Differential
Non-Linearity |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-71 | Based on 1024 channels, the
differential non-linearity shall be less than ±10% of the average
channel width. |
Test | FREE Comp Perf Test, ACD-Proc-000051 | Verified FREE 0102, Chassis 4LA, WOA ACD-00022 Event 220 FREE 0103, Chassis 2RA, WOA ACD-00023 Event 220 FREE 0104, Chassis 2LA, WOA ACD-00024 Event 220 FREE 0106, Chassis 4RA, WOA ACD-00026 Event 220 FREE 1102, Chassis 1RB, WOA ACD-00028 Event 220 FREE 1103, Chassis 4LB, WOA ACD-00029 Event 220 FREE 1104, Chassis 3LA, WOA ACD-00030 Event 220 FREE 1105, Chassis 3RB, WOA ACD-00031 Event 220 FREE 1107, Chassis 2RB, WOA ACD-00033 Event 220 FREE 1108, Chassis 2LB, WOA ACD-00034 Event 220 FREE 1109, Chassis 4RB, WOA ACD-00035 Event 220 FREE 11010, Chassis 1LA, WOA ACD-00036 Event 220 |
Not directly verifiable at system level, see
subsystem verification |
Qualification | See subassembly verification | ... | When
a Level 1 Trigger Acknowledge (TACK (ACD3-58)(IN) The ACD electronics shall collect and tr (ACD3-52)(IN) |
ACD4-72 | 5.9.7 Temperature Stability |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-73 | The analog signal processing
chain shall exhibit temperature stability of gain better than 500 ppm
per degree C over the operating temperature range. For both the low
range (0 to 6.4 pC ±20%, = 10 MIPs) and the
high range (6.4 ±20% to 640 pC, 10 to 200
MIPs, the requirement is 200 MIPs but design goal is 1000 MIPs), the
analog signal processing chain shall exhibit temperature stability of
its baseline better than 0.05% of full scale per degree C. |
Test | FREE Comp Perf Test, ACD-Proc-000051 |
Probably over tested at one end but not sure if fully tested over full range at subassembly level, check this. | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270)* Meet for ACD as whole (averaged) but some channels fail indivdually, not a large issue but temp effect on performanc noted. Better at colder temps which is where ACD typical orbit is. SEE GLAST LAT ACD Performance Summary from Environmental Testing ACD-RPT-000374 |
Qualification, Acceptance | ACD-INT-02318 * ACD-INT-02309 (MARGIN TEST) * We meet the req for ACD as averaged over the channels but individual channels dotn meet this. Worst case channels can be up to 1% of full scale per deg C - SEE GLAST LAT ACD Performance Summary from Environmental Testing ACD-RPT-000374 |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
ACD-INT-02318 ACD-INT-02309 (MARGIN TES (ACD4-79)(OUT) (ACD4-73)(OUT) The threshold for VETO detection of char (ACD3-18)(IN) The average detection efficiency for min (ACD3-20)(IN) When a Level 1 Trigger Acknowledge (TACK (ACD3-58)(IN) The ACD electronics shall collect and tr (ACD3-52)(IN) |
ACD4-74 | 5.9.8 Test Pulse Injection |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-75 | For test purposes, the ACD
electronics shall incorporate the capability to be artificially
stimulated by a test charge, via commands. The test charge injection
range shall be 0 - 200 MIP with a goal of 0 - 1000 MIP. |
Test, Simulation | FREE Comp Perf Test, ACD-Proc-000051 GAFE Functional Test |
... | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
ACD electronics shall collect and tr (ACD3-52)(IN) |
ACD4-76 | 5.9.9 Digital Housekeeping |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-77 | The state of all ACD command
registers shall be available for readout via GEM commands. The GEM will
scale all ACD VETO and HLD rates and transmit the results in low rate
telemetry. |
Test | FREE Comp Perf Test, ACD-Proc-000051 |
... | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
ACD
shall make available other housekeep (ACD3-66)(IN) |
ACD4-78 | 5.9.10 Temperature Monitoring |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-79 | ACD shall provide temperature
transducer signals for survival, safe, and operational modes. Signals
are specifically defined in ACD ICD. ACD does not provide the actual
temperature monitoring. |
Test | Checked at full assembly level | ... | ACD CPT (ACD-PROC-000270). |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02334 |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
(ACD4-73)(IN) ACD shall make available other housekeep (ACD3-66)(IN) |
ACD4-80 | 5.10 High Voltage Bias Supply |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-81 | 5.10.1 HVBS Output Voltage
Range |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-82 | The HVBS shall operate from +400
V to +1310 V. |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.4 Chassis Full Functional Test ( ACD-PROC-000222 ) |
Verified to 1300V Chassis 1R, WOA ACD-01615 Event 70, Chassis 1L, WOA ACD-01616 Event 70 Chassis 3R, WOA ACD-01617 Event 70 , Chassis 3L, WOA ACD-01618 Event 70 Chassis 2R, WOA ACD-01622 Event 70 , Chassis 2L, WOA ACD-01623 Event 70 Chassis 4R, WOA ACD-01624 Event 70 , Chassis 4L, WOA ACD-01625 Event 70 |
ACD CPT (ACD-PROC-000270) up to 1000V which
is above likley on orbit max value ACD Margin Test (ACD-PROC-000352) up to 1000V |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) up to 1000v, 1000-1300 done at subsystem level |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
The
ACD shall meet the structural, ther (ACD3-97)(IN) The ACD photomultiplier bias supplies sh (ACD3-110)(IN) |
ACD4-83 | 5.10.2 HVBS Output Current |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-84 | The HVBS shall provide sufficient
current to drive all PMTs (max 18) on each FREE circuit card at the
maximum voltage (+1310V). |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.5 |
Verified to 1300V Chassis 1R, WOA ACD-01615 Event 70, Chassis 1L, WOA ACD-01616 Event 70 Chassis 3R, WOA ACD-01617 Event 70 , Chassis 3L, WOA ACD-01618 Event 70 Chassis 2R, WOA ACD-01622 Event 70 , Chassis 2L, WOA ACD-01623 Event 70 Chassis 4R, WOA ACD-01624 Event 70 , Chassis 4L, WOA ACD-01625 Event 70 |
ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) up to 1000V which is above likely on orbit max
value ACD Margin Test (ACD-PROC-000352) up to 1000V |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) up to 1000V, 1000-1300 done at subsystem level |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
ACD shall detect energy deposits wit (ACD3-16)(IN) |
ACD4-85 | 5.10.3 HVBS Limiting Output
Current |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-86 | The HVBS output current shall be
limited to protect the ACD from one PMT short. At maximum output
voltage, each HVBS shall be capable of supplying a total output current
of 60 mA. The nominal output current will
be 36 mA. |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.5 |
Verified WOA's ACD-00321 to 00350 |
Not directly verifiable at system level, see
subsystem verification |
Qualification | See subassembly verification | ... | The
ACD total electronics power consumpt (ACD3-91)(IN) No single failure in the ACD electronics (ACD3-68)(IN) |
ACD4-87 | 5.10.4 HVBS Output Voltage
Adjustment |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-88 | The HVBS output voltage shall be
programmable with an analog input. The limiting output current of each
HVBS shall be ~80 mA. |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.5 |
Verified WOA's ACD-00321 to 00350 |
Not directly verifiable at system level, see
subsystem verification ) |
Qualification | See subassembly verification | ... | The
threshold for VETO detection of char (ACD3-18)(IN) The High-Threshold shall be adjustable f (ACD3-32)(IN) The ACD electronics shall collect and tr (ACD3-52)(IN) |
ACD4-89 | 5.10.5 HVBS Input Power |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-90 | Each HVBS shall operate from a
supply voltage of 28V ± 2V (changed from
+/-1v because LAT could not meet it), with possible input ripple of 10
mV (frequency range 50 Hz to 50 MHz). The noise shall be less than 100
mV RMS from DC to 1.0 MHz. |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.5 |
Verified WOA's ACD-00321 to 00350 |
Not directly verifiable at system level, see
subsystem verification ) |
Qualification | See subassembly verification | ... | 9.7.
Power 26 (ACDICD-45)(IN) |
ACD4-91 | 5.10.6 HVBS Line and Load
Regulation |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-92 | The HVBS output voltage shall be
regulated to ±0.5% for all combinations of input voltage and load
current. (This produces ~5% change in PMT gain). |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.5 |
Verified. WOA's ACD-00321 to 00350 |
Not directly verifiable at system level, see
subsystem verification |
Qualification | See subassembly verification | ... | The
threshold for VETO detection of char (ACD3-18)(IN) The average detection efficiency for min (ACD3-20)(IN) |
ACD4-93 | 5.10.7 HVBS Output Ripple |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-94 | The HVBS output voltage ripple
shall be compatible with the ACD ASIC design. The HVBS output voltage
ripple shall not exceed ±2 mV p-p over the
frequency range 100 Hz to 50 MHz |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.8 |
Verified WOA's ACD-00321 to 00350 |
Not directly verifiable at system level, see subsystem verification | Qualification | See subassembly verification | ... | The
ACD shall detect energy deposits wit (ACD3-16)(IN) |
ACD4-95 | 5.10.8 HVBS Power Consumption |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-96 | The HVBS power dissipation at
maximum output voltage and limiting current shall be <300 mW. |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.5 |
Verified if interpreted as per HVBS. WOA's ACD-00321 to 00350 |
ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270)) | Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
ACD total electronics power consumpt (ACD3-91)(IN) |
ACD4-97 | 5.10.9 HVBS Ramp Up/Down Time |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-98 | For either application or removal
of input power, the time for the HVBS output voltage to reach its final
level (for turn-on, within regulation tolerance) shall be between 5 and
30 seconds. Note: The 5 second requirement is driven by the PMT, the 30
seconds is driven by the maximum tolerable time for HVBS to stabilize
when entering/exiting the SAA. |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.7.1 |
Done, 3-14 sec measured, under 5 sec not much of
an issue WOA's ACD-00321 to 00350 |
Not directly verifiable at system level, see subsystem verification | Qualification | See subassembly verification | ... | The
ACD shall meet the structural, ther (ACD3-97)(IN) No single failure in the ACD electronics (ACD3-68)(IN) |
ACD4-99 | 5.10.10 HVBS Temperature
Stability |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-100 | The HVBS output voltage
temperature stability shall be no worse than 500 ppm/C. |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.9 |
Verified. WOA's ACD-00928 to 00942 |
Not directly verifiable at system level, see subsystem verification | Qualification | See subassembly verification | ... | The
average detection efficiency for min (ACD3-20)(IN) |
ACD4-101 | 5.10.11 HVBS Output Voltage
Monitoring |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-102 | The HVBS shall provide a linear
output voltage monitor (for transmission to the AEM) in the range 0.0
to 2.5 V. |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.5 |
Verified WOA's ACD-00321 to 00350 |
ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
9.5.
Signal Description 23 (ACDICD-41)(IN) ACD shall make available other housekeep (ACD3-66)(IN) |
ACD4-103 | 5.10.12 HVBS Ground Isolation |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-104 | The DC impedance between input
and output grounds shall be 100 ohms ±20%. |
Test | Chassis Safe To Mate (ACD-PROC-000333) | Verified WOA's ACD-01615 to 01625 |
Chassis Safe To Mate (ACD-PROC-000333) |
Qualification, Acceptance | ACD-INT-02329 |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
10.6.
Grounding and Shielding 34 (ACDICD-61)(IN) |
ACD4-105 | 5.10.13 HVBS Oscillator
Frequency |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-106 | The HVBS shall utilize an
oscillator frequency >100 kHz (to minimize EMI issues). |
Test | HVBS Functional Test (ACD-PROC-000064) Sec 4.4 |
Verified WOA's ACD-00321 to 00350 |
Not directly verifiable at system level, see
subsystem verification |
Qualification | See subassembly verification | ... | The
ACD shall meet the structural, ther (ACD3-97)(IN) |
ACD4-107 | 5.10.14 HVBS EMI and
Susceptibility |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-108 | The HVBS shall neither generate
nor be susceptible to electromagnetic interference exceeding the
EMI/EMC test requirement, GSFC-433-RQMT-0005. |
Analysis, Test | EMI test procedure (ACD-PROC-000275) | Verified. WOA ACD-01742 |
EMI test plan (ACD-PLAN-000215) |
Qualification | See subassembly verification -Chassis EMI test
WOA |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
ACD shall meet the structural, ther (ACD3-97)(IN) |
ACD4-109 | 5.11 PMT |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-110 | 5.11.1 PMT Bias Chain Total
Resistance |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-111 | The total resistance of a PMT
bias chain shall be such as to result in a nominal current (at the
maximum HVBS voltage) of 2 microamps (~100 times the PMT average anode
current.) |
Test | Resistor Network Test Procedure (ACD-PROC-000065) | Verified. Too many WOAs to list, one per PMT. Done by Daniels and Rock | Not directly verifiable at system level, see
subsystem verification |
Qualification | See subassembly verification | ... | The
ACD shall detect energy deposits wit (ACD3-16)(IN) The average detection efficiency for min (ACD3-20)(IN) |
ACD4-112 | 5.11.2 PMT Bias Chain Filter
Resistance |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-113 | At least four percent of the
total resistance of the bias chain shall be in a filter resistor(s) at
the high voltage input. This PMT bias chain filter resistance protects
against a PMT short with a current limiting resistor and filters out
HVBS ripple. |
Analysis | GLAST Resistor Network Board Schematic (ACD-DWG-2054543 | Verified, & Rechecked by D.S. 11/5/04 | N/A | Development | N/A | ... | The
false VETO signal rate due to noise (ACD3-28)(IN) No single failure in the ACD electronics (ACD3-68)(IN) |
ACD4-114 | 5.11.3 PMT Bias Chain
Resistor Distribution |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-115 | The number and values of the
remaining resistors in the bias chain shall be selected to be
compatible with the selected PMT, Hamamatsu R4443. |
Analysis | GLAST Resistor Network Board Schematic
(ACD-DWG-2054543 |
Verified, & Rechecked by D.S. 11/5/04 | N/A | Development | N/A | ... | The
ACD shall detect energy deposits wit (ACD3-16)(IN) |
ACD4-116 | 5.11.4 PMT Anode Signal
Coupling |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-117 | The PMT anode signal shall be
coupled into the associated analog electronics via two capacitors of
680 pF in series. A charge leakage bleed-off resistor of at least
1-mega ohms shall be incorporated on the low-voltage side of the
capacitor pair. |
Analysis | GLAST Resistor Network Board Schematic
(ACD-DWG-2054543 |
Verified, & Rechecked by D.S. 11/5/04. Capacitors C4 and C6, Res R14 | N/A | Development | N/A | ... | The
ACD shall detect energy deposits wit (ACD3-16)(IN) |
ACD4-118 | 5.11.5 PMT Output Load
Resistor |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-119 | A load resistor of > 10
KW shall terminate the bias network. |
Analysis | GLAST Resistor Network Board Schematic (GD2054543) | Verified. ACD-PROC-000203 |
N/A | Development | N/A | ... | The
ACD shall detect energy deposits wit (ACD3-16)(IN) |
ACD4-120 | 5.11.6 PMT Bias Chain Dynode
Decoupling |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-121 | The resistors biasing the last
three-dynode stages shall be bypassed by capacitors to prevent a drop
in gain for very large pulses or the maximum expected high rate of
pulses (<1% gain change for 3kHz rate). |
Analysis | GLAST Resistor Network Board Schematic (GD2054543) | Verified, & Rechecked by D.S. 11/5/04. Cap C1,C2,C3 | N/A | Development | N/A | ... | The
ACD shall detect energy deposits wit (ACD3-16)(IN) |
ACD4-122 | 5.12 Radiation Tolerance |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-123 | The ACD electronics shall remain
within specifications after a total ionizing radiation dose of 4.5
kRad(Si). |
Analysis, Test | LAT-TD-05196, LAT-TD-05197, LAT-TD-05198, LAT-TD-05199, LAT-TD-05201 | Done |
Approved Parts List, LAT-TD-05196, LAT-TD-05197,
LAT-TD-05198, LAT-TD-05199, LAT-TD-05201 |
Qualification | See subassembly verification | ... | The
ACD shall meet the structural, ther (ACD3-97)(IN) |
ACD4-124 | 5.12.1 Single Event Upset
Tolerance |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-125 | A single event upset (SEU) shall
not cause the ACD electronics to transition to an unsafe state. |
Analysis, Test | TAMU SEU test procedure, LAT-TD-05191, LAT-TD-05192 | Done |
Approved Parts List, LAT-TD-05191, LAT-TD-05192 |
Qualification | See subassembly verification | ... | No
single failure in the ACD electronics (ACD3-68)(IN) The ACD shall maintain the specified per (ACD3-108)(IN) |
ACD4-126 | 5.12.2 Latchup Tolerance |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-127 | Parts that show any SEE’s at an
LET lower than 37 MeV*cm2/mg shall not degrade the mission
performance. |
Analysis, Test | TAMU SEU test procedure LAT-TD-05191,
LAT-TD-05192, LAT-TD-03503 |
Done |
Approved Parts List, LAT-TD-05191, LAT-TD-05192,
LAT-TD-03503 |
Qualification | See subassembly verification | ... | The
ACD shall meet the structural, ther (ACD3-97)(IN) No single failure in the ACD electronics (ACD3-68)(IN) The ACD shall maintain the specified per (ACD3-108)(IN) |
ACD4-128 | 5.13 Reliability |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-863 | The ACD shall meet the
reliability allotment from LAT is currently .96 over 5 years. |
Analysis, Simulation | Tony DiVenti's Reliabity Report, Reliability
Prediciton Assessments for the GLAST ACD. LAT PRA - LAT-TD-02510-02 Failure modes effect analysis and critical items list report ACD-RPT-000042, LAT Failure modes and effects analysis - LAT-TD-000374 Limited Life Analysis for ACD Report - ACD-RPT-000039 |
Done, LAT PRA - LAT-TD-02510-02 Failure modes effect analysis and critical items list report ACD-RPT-000042, LAT Failure modes and effects analysis - LAT-TD-000374 Limited Life Analysis for ACD Report - ACD-RPT-000039 |
Reliability Prediciton Assessments for the LAT
PRA - LAT-TD-02510-02 Failure modes effect analysis and critical items list report ACD-RPT-000042, LAT Failure modes and effects analysis - LAT-TD-000374 Limited Life Analysis for ACD Report - ACD-RPT-000039 Prediction is ~.97 |
Development, Acceptance | N/A | ... | No
single failure in the ACD electronics (ACD3-68)(IN) |
ACD4-129 | 5.13.1 ACD Electronics
Reliability |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-130 | No single failure in the ACD
electronics shall result in complete loss of signal from more than one
ACD detector (tile or ribbon). The overall calculated reliability of
the ACD electronics assembly shall be at least 0.98 in one year. |
Analysis, Simulation | By design, Tony DiVenti's Reliabity Reports, LAT
PRA - LAT-TD-02510-02 Failure modes effect analysis and critical items list report ACD-RPT-000042, LAT Failure modes and effects analysis - LAT-TD-000374 Limited Life Analysis for ACD Report - ACD-RPT-000039 |
Done | Reliability Prediciton Assessments for the GLAST
ACD. (LAT PRA - LAT-TD-02510-02 Failure modes effect analysis and critical items list report ACD-RPT-000042, LAT Failure modes and effects analysis - LAT-TD-000374 Limited Life Analysis for ACD Report - ACD-RPT-000039 |
Development, Acceptance | N/A | ... | No
single failure in the ACD electronics (ACD3-68)(IN) |
ACD4-131 | 5.13.2 ACD Tile Detector
Assembly and Scintillator Ribbon Reliability |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-132 | The probability of the loss of
both VETO signals from a specific scintillator tile shall be less than
1% in 5 years). The probability of the loss of VETO signals from a
scintillator ribbon shall be less than 5% in 5 years. The overall
calculated reliability of ACD scintillating tiles and scintillator
ribbons shall be at least 0.99 in one year. |
Analysis, Simulation | Tony DiVenti's Reliabity Reports, LAT PRA -
LAT-TD-02510-02 Failure modes effect analysis and critical items list report ACD-RPT-000042, LAT Failure modes and effects analysis - LAT-TD-000374 Limited Life Analysis for ACD Report - ACD-RPT-000039 |
Done | Reliability Prediciton LAT PRA - LAT-TD-02510-02 Failure modes effect analysis and critical items list report ACD-RPT-000042, LAT Failure modes and effects analysis - LAT-TD-000374 Limited Life Analysis for ACD Report - ACD-RPT-000039 |
Development, Acceptance | N/A | ... | No
single failure in the ACD electronics (ACD3-68)(IN) The loss of any one detector element (ti (ACD3-70)(IN) The probability of the loss of both VETO (ACD3-74)(IN) |
ACD4-133 | 5.13.3 Requirement moved to
5.12.2. |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-134 | 5.13.4 Requirement moved to
5.12.1. |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-135 | 5.13.5 ACD Micrometeoroid
Shield/Thermal Blanket Reliability |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-136 | The overall calculated
reliability of an ACD micrometeoroid shield/thermal blanket shall be at
least 0.98 in one year. (see steve Ritz RFA response) |
Analysis, Test, Simulation | Johnson Shield Analysis - ACD MICROMETEOROID
SHIELD PERFORMANCE ANALYSIS ACD-RPT-000373 |
Done | Johnson Shield Analysis (ACD-RPT-000373), MMS/MLI spec (ACD-RQMT-000167), design details ACD-PLAN-000285) |
Development | N/A, Shot test | ... | No
single failure in the ACD electronics (ACD3-68)(IN) |
ACD4-137 | 5.13.6 Requirement combined
with 5.13.2 |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-138 | 5.14 Commands |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-139 | 5.14.1 Detector On/Off
Commands |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-140 | The AEM and ACD will implement
commands to allow each group of 18 PMT's to be powered on and off
together. |
Test | GARC testing and FREE Comp Perf Test, ACD-Proc-000051 (high voltage enable/disable) | Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site, and ACD perf report
ACD-RPT-000374 http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
10.3.
GARC Registers 31 (ACDICD-54)(IN) The ACD shall implement commands to allo (ACD3-77)(IN) |
ACD4-141 | 5.14.2 Detector Gain Commands |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-142 | The ACD shall implement
adjustability of the high voltage applied to the group of 18 PMT's
associated with a single board. |
Test | GARC testing, FREE Comp Perf Test, ACD-Proc-000051 (high voltage DAC) | Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
threshold for VETO detection of char (ACD3-18)(IN) The High-Threshold shall be adjustable f (ACD3-32)(IN) The ACD shall implement commands to allo (ACD3-79)(IN) |
ACD4-143 | 5.14.3 Electronics On/Off
Commands |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-144 | The AEM will implement commands
to allow each ACD electronics board to be separately powered on and off. |
Test | Chassis Full Functional Test ( ACD-PROC-000222 ), LAT needs to verify | Done at ACD level | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
9.7.
Power 26 (ACDICD-45)(IN) No single failure in the ACD electronics (ACD3-68)(IN) The ACD shall implement commands to allo (ACD3-81)(IN) |
ACD4-145 | 5.14.4 VETO Threshold
Commands |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-146 | The ACD shall implement
adjustability of the VETO threshold for each PMT. |
Test | FREE Comp Perf Test, ACD-Proc-000051 | Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) (ACD4-28)(IN) The threshold for VETO detection of char (ACD3-18)(IN) The High-Threshold shall be adjustable f (ACD3-32)(IN) The ACD shall implement commands to set (ACD3-83)(IN) |
ACD4-147 | 5.14.5 High-Threshold
Commands |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-148 | The ACD shall implement
adjustability of the High-Level Discriminator Threshold for each PMT. |
Test | FREE Comp Perf Test, ACD-Proc-000051 | Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) (ACD4-35)(IN) The threshold for VETO detection of char (ACD3-18)(IN) The High-Threshold shall be adjustable f (ACD3-32)(IN) The ACD shall implement commands to set (ACD3-85)(IN) |
ACD4-149 | 5.14.6 ACD Monitoring
Commands |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-150 | The ACD shall implement
adjustability of the monitoring functions of the ACD electronics,
including test charge injection level. |
Test | FREE Comp Perf Test, ACD-Proc-000051 | Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
ACD electronics shall collect and tr (ACD3-52)(IN) The ACD shall implement commands to allo (ACD3-87)(IN) |
ACD4-151 | 5.14.7 TACK Format |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-152 | TACK format shall be in
compliance with ICD definition of TACK. |
Test | FREE Comp Perf Test, ACD-Proc-000051 | Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
10.1.
AEM to ACD Command Format 27 (ACDICD-47)(IN) When a Level 1 Trigger Acknowledge (TACK (ACD3-58)(IN) |
ACD4-153 | 5.14.8 Command Format |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-154 | Command formats shall be in
compliance with ICD format definitions. |
Test | FREE Comp Perf Test, ACD-Proc-000051 | Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
10.
ACD Command and Data Format 27 (ACDICD-46)(IN) |
ACD4-155 | 5.14.9 SAA Mode commands |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-156 | The ACD photomultiplier HVBSs
shall switch into a low-gain mode to protect the phototubes in very
high intensity particle conditions (> 10 kHz in an individual tile)
such as the South Atlantic Anomaly. (Accomplished by HVBS command from
AEM to GARC) |
Test | LAT must verify, FREE Comp Perf Test, ACD-Proc-000051 (use_saa_level) | Done, must be verified at LAT also | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) Do it via ramping the HV up and then back down ACD Margin Test (ACD-PROC-000352) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) Must be done at LAT also |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
ACD photomultiplier bias supplies sh (ACD3-110)(IN) The ACD shall implement commands to swit (ACD3-89)(IN) |
ACD4-157 | 5.14.10 Notification of Mode
Change |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-158 | The ACD shall identify times
when it switches into low-gain mode for high counting rate conditions. |
Test | LAT must verify, FREE Comp Perf Test,
ACD-Proc-000051 (use_saa_level) |
Done, must be verified at LAT. |
ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) |
Qualification | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
The
ACD shall be able to tell (via volta (ACD3-112)(IN) |
ACD4-159 | 5.15 Output Data Formats |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-160 | ACD Output data formats shall be
in compliance with ICD format definitions. |
Test | Chassis Full Functional Test ( ACD-PROC-000222 ) | Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) |
http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
10.5.
ACD to AEM Data Format 33 (ACDICD-58)(IN) |
ACD4-161 | 5.16 Power Consumption |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-162 | The ACD total electronics power
consumption shall not exceed orbital average of 10.5 W (11.5W
now)conditioned. (reduced from 31 W in May/03, increased to 11.5W in
May
05 |
Analysis, Test | Chassis Full Functional Test ( ACD-PROC-000222 ) | Done | Not directly verifiable at ACD level |
Qualification, Acceptance | LAT-XR-06636-01 Change Request. ACD total power 11.34 W |
The
ACD total electronics power consumpt (ACD3-91)(IN) |
|
ACD4-163 | 5.17 Total ACD Mass |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-164 | The total mass of the ACD shall
not exceed 295 Kg. (see CR) |
Analysis, Test | CAD Model Mass Properties, Mass estimate table | ... | ACD-PROC-000195, ACD-PLAN-000152, 2072298s |
Acceptance | ACD-INT-02332 | see ACD-INT-02332 | The
total mass of the ACD and micrometeo (ACD3-93)(IN) |
ACD4-165 | 5.18 Environmental
Requirements |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-166 | The ACD shall meet all
structural, thermal, EM and radiation environment requirements. See LAT
Environmental Specification, LAT-SS-00778 |
... | See HVBS, FREE, PMT, Chassis, TSA, TDA Vibration
and TVAC test plans. Radiation, see section 5.12 |
Done. See test report Web site. |
See ACD vibration, TVAC, EMI test plans. Radiation not verified at higher level. ACD Thermal Vacuum Procedure (ACD-PLAN-000347), ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270), EMI test plan (ACD-PLAN-000215), vib test plan (ACD-PLAN-000334), ACD-PLAN-000335 | Qualification, Acceptance | ACD-INT-02322, ACD-INT-02334 |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
The
ACD shall meet the structural, ther (ACD3-97)(IN) The thermal blanket/micrometeoroid shiel (ACD3-104)(IN) |
ACD4-167 | 5.18.1 Ground - Handling and
transportation Vibration and Shock |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-168 | Deleted in LAT level IIb
12/10/01, see ACD Transportation and Procedure (ACD-PLAN-000369) and
ground env section of LAT Environmental Specification, LAT-SS-00778 |
Analysis | n/a | N/A | n/a | Development | N/A | ... | The
ACD shall meet the structural, ther (ACD3-97)(IN) |
ACD4-169 | 5.18.2 Orbit - Flight
temperature ranges |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-856 | ACD shall be able to handle
orbit survival and operational temperature ranges specified in the ACD
ICD (LAT-SS-363) and LAT Environmental Specification, LAT-SS-00778 |
Analysis, Test | See HVBS, FREE, PMT, Chassis, TDA and TVAC test
plans. |
Done | ACD Thermal Vacuum Procedure (ACD-PLAN-000347),
ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270) |
Qualification, Acceptance | ACD-INT-02334 | See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ |
11.
Thermal Interface and Heat Transfer (ACDICD-65)(IN) The ACD shall meet the structural, ther (ACD3-97)(IN) |
ACD4-185 | 5.18.3 Launch - Static Load |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-186 | ACD shall be capable of normal
operation after exposure to launch loads as given LAT Environmental
Specification, LAT-SS-00778 and in SI/SC IRD (sec 3) |
Analysis, Test | Structural analysis Encompased in TSA and chassis vibration test plans | Done | Structural Analysis, vib test Vib test plan -ACD-PLAN-000334 |
Qualification, Acceptance | ACD-INT-02322 | ... | The
ACD shall meet the structural, ther (ACD3-97)(IN) |
ACD4-187 | 5.18.4 Launch - Random
Vibrations |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-188 | ACD shall be capable of normal
operation after exposure to ASD levels referred to in LAT Environmental Specification, LAT-SS-00778 ( previously referred to the SC IRD ) |
Analysis, Test | See HVBS, FREE, PMT, Chassis, TSA, TDA
Vibration. (ACD-PLAN -000111 and 000161) |
Done | Structural Analysis ACD Vibration Test Plan ACD-PLAN-000334 (Electronics and Mechanical Random tests will be listed separetly in the above test plan, see Table 2 - Test Matrix for what assemblies and components see what accept and qual tests) |
Qualification, Acceptance | ACD-INT-02322 | See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
The
ACD shall meet the structural, ther (ACD3-97)(IN) |
ACD4-189 | 5.18.5 Launch - Acoustic
Loads |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-190 | Capable of normal operation
after exposure to acoustic loads given in the LAT Environmental
Specification, LAT-SS-00778 (this used to refer to SI/SC IRD which
refers to spec 433-SPEC-0003), the acoustic equivalant design loads are
derived in LAT-SS-00778 (ACD previously refered to ACD SPEC-3006).
(Note : information on acoustic abatement at the GLAST launch pad and
preliminary acoustic loads analyses for ACD have reduced acoustic loads) |
Analysis, Test | Analysis, ACD-PLAN-000196 | mech subassembly acoustic test plan -ACD-PLAN-000196 | Structural Analysis ACD Acoutics Test Plan (ACD-PLAN-000335) |
Qualification, Acceptance | ACD-INT-02334 | See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
The
ACD shall meet the structural, ther (ACD3-97)(IN) |
ACD4-191 | 5.18.6 Launch - Shock |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-192 | Capable of normal operation
after exposure to external shock levels given in LAT Environmental
Specification, LAT-SS-00778, as applicable, attenuated to SI/SC
interface values. |
Analysis | Shock Analysis ACD-DOC-000388 |
Done | Structural Analysis | Development | N/A | ... | The
center of mass of the ACD and microm (ACD3-95)(IN) |
ACD4-193 | 5.18.7 Launch - temperature |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-194 | Tolerate 0 to 30 °C in launch
configuration |
Analysis | Analysis | Done | Thermal Analysis Structural Analyisis (tile gap contact report) |
Development | N/A | The
ACD shall meet the structural, ther (ACD3-97)(IN) |
|
ACD4-195 | 5.18.8 Launch - Pressure
(See LAT Env Spec, LAT-SS-00778) |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-196 | 5.18.9 Part 1 On-orbit -
Thermal |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-197 | Flux Env - Tolerate Earth IR
loads of 265 W/m^2 (hot case), and 208 W/m^2 (cold case), plus Earth
Albedo factor of 0.40 (hot case), and 0.25 (cold case) . See LAT
Environmental Specification, LAT-SS-00778 and the LAT Thermal Design
Parameters Study LAT-TD-00224. |
Analysis | Thermal analysis (in CDR presentation) | Done | Thermal Vacuum Test Plan ACD-PLAN-000347 |
Development | ACD-INT-02334 indirectly | Check vs ICD numbers or link to ICD | 11.
Thermal Interface and Heat Transfer (ACDICD-65)(IN) |
ACD4-198 | Environment |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-199 | Solar Flux - 1419 W/m^2 (hot
case), and 1286 W/m^2 (cold case), sustained exposure on +X side. See
LAT Environmental Specification, LAT-SS-00778 and the LAT Thermal
Design Parameters Study LAT-TD-00224. |
Analysis | Thermal analysis (in CDR presentation) | Done | Thermal Vacuum Test Plan ACD-PLAN-000347 |
Development | ACD-INT-02334 indirectly | Check vs ICD numbers or link to ICD | 11.
Thermal Interface and Heat Transfer (ACDICD-65)(IN) |
ACD4-200 | 5.18.9 Part 2 On-orbit -
Thermal general |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-857 | Handle orbit interface, survival
and operational thermal values specifed in ICD. |
Analysis, Test | Thermal anslysis, Chassis, TDA, thermal vac test plan | Done | ACD Thermal Vacuum Procedure (ACD-PLAN-000347), ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270) | Qualification, Acceptance | ACD-INT-02334 | See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
11.
Thermal Interface and Heat Transfer (ACDICD-65)(IN) The thermal blanket/micrometeoroid shiel (ACD3-106)(IN) The ACD shall meet the structural, ther (ACD3-97)(IN) |
ACD4-202 | 5.18.10 On-Orbit Charged
Particle Radiation |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-203 | Deleted from LAT IIb |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-204 | 5.18.11 On-Orbit - Meteoroid
and Debris Flux |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-205 | Instrument must withstand
meteoroid and debris flux estimates given in GLAST MSS Section
'Micrometeoroid and Debirs Flux' |
Analysis, Test | Johnson Shield Analysis - ACD MICROMETEOROID
SHIELD PERFORMANCE ANALYSIS ACD-RPT-000373 |
Done, Also test shot done on engineering unit sample | Johnson Shield Analysis - ACD MICROMETEOROID
SHIELD PERFORMANCE ANALYSIS ACD-RPT-000373 |
Development | N/A | ... | The
thermal blanket/micrometeoroid shiel (ACD3-104)(IN) |
ACD4-206 | 5.19 Performance Life |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-207 | The ACD shall maintain the
specified performance for a minimum of five years in orbit except in
the case of one tile failure . |
Analysis | Reliability Prediciton LAT PRA - LAT-TD-02510-02 Failure modes effect analysis and critical items list report ACD-RPT-000042, LAT Failure modes and effects analysis - LAT-TD-000374 Limited Life Analysis for ACD Report - ACD-RPT-000039 |
Done | Reliability Prediciton LAT PRA - LAT-TD-02510-02 Failure modes effect analysis and critical items list report ACD-RPT-000042, LAT Failure modes and effects analysis - LAT-TD-000374 Limited Life Analysis for ACD Report - ACD-RPT-000039 |
Development, Acceptance | N/A | ... | The
ACD shall maintain the specified per (ACD3-108)(IN) |
ACD4-208 | 5.20 Rate Requirement for
Operation within Specification |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-209 | Each ACD PMT and its associated
electronics shall be capable of operating within the specifications
above at MIP rates up to 3 kHz. (The 3kHz per tile is just above the
high count rate.) |
Test | Some tested wth light leaks | G3 does not allow us to test this , only tested at subsytem level with the few that have seen light leaks during test | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) via the ribbon PMTs which all run higher than 3kHz.
Other channels of same design verified via similairty but will never
need to run that high. ( light leak test only other way) |
Qualification, Acceptance | ACD-INT-02318 via ribbon channels | ... | Each
ACD PMT and its associated electron (ACD3-114)(IN) |
ACD4-210 | 5.21 Testability |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-211 | The ACD electronics shall
incorporate additional capabilities as needed to enable thorough and
efficient testing, throughout the GLAST mission, of the functions
required of the ACD. |
Inspection, Test | General design, various tests like FREE CPT, ACD CPT | Done | ACD Comprehensive Performance Test (CPT) (ACD-PROC-000270) | Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN
TEST) ACD-INT-02318 ACD-INT-02322 ACD-INT-02322 ACD-INT-02334 |
See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
No
single failure in the ACD electronics (ACD3-68)(IN) ACD shall be testable to confirm perform (ACD3-72)(IN) |
ACD4-212 | 5.22 Center of Mass |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-213 | The ACD center of mass shall be
X=Y<10 mm and Z<330 mm from the C.S. (was 393, current estimate
is 318mm) as listed in the ACD-LAT ICD (LAT-SS-00363) |
Analysis, Test | n/a | ... | ACD-PLAN-000152, ACD-PROC-000195 CAD Model Mass Properties |
Development, Acceptance |
ACD-INT-02331 | see ACD-INT-02331 | 6.1.
General Description 12 (ACDICD-11)(IN) The center of mass of the ACD and microm (ACD3-95)(IN) |
ACD4-214 | 5.23 Volume |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-215 | As shown in the ACD IDD
(Interface Definition Drawings) (LAT-DS-00309), (also refer to LAT-DS
00040 & 00038), the ACD volume shall be: |
Analysis, Inspection | n/a | ... | ACD survey Plan, LAT-DS-000309, ACD-PLAN-000285 | Development, Acceptance | ACD-INT-02207 | see ACD-INT-02207 ACD Survey Report, ACD-RPT-000387 |
The
dimensions of the ACD plus the micro (ACD3-99)(IN) |
ACD4-216 | Inside LAT Grid: 1574 x 1574 x
-204.7 mm |
... | ... | ... | ACD survey Plan, LAT-DS-000309, ACD-PLAN-000285 | Development, Acceptance | ACD-INT-02207 | ACD Survey Report, ACD-RPT-000387 | ... |
ACD4-217 | Inside LAT Tracker: 1515.5 x
1515.5 x 650 mm |
... | ... | ... | ACD survey Plan, LAT-DS-000309, ACD-PLAN-000285 | Development, Acceptance | ACD-INT-02207 | ACD Survey Report, ACD-RPT-000387. | ... |
ACD4-218 | Outside: 1820 x 1820 x 1050 mm LAT ACD Interface Definition Drawings LAT-DS-00309-04. The previous outside volume was 1806x1806x1050 and before that 1796 x 1796 x 1015 mm. |
... | CAD model |
... | ACD survey Plan, LAT-DS-000309, ACD-PLAN-000285 | Development, Acceptance | ACD-INT-02207 CR submitted for soft stay-clear nonconformances |
ACD Survey Report, ACD-RPT-000387 | ... |
ACD4-219 | 5.24 Instrument Coverage |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-220 | The ACD TDAs shall cover the top
and sides of the LAT tracker down to 2 cm below the lowest SSD in the
tracker and to within 2 mm of the top of the CsI in the calorimeter,
with a goal to cover to the the top of the CsI in the calorimeter. See
ACD IDD (Interface Definition Drawings) (LAT-DS-00309). |
Analysis, Inspection | CAD model at LAT | Done at ACD level. |
CAD model, verifible only by LAT. Agreed to by D. Horn | Development | Verifed at LAT although we just noticed a
dimension we probably dont meet the tolerances for in a late ICD
change. CR submitted. |
... | The
ACD shall cover the top and sides of (ACD3-22)(IN) |
ACD4-221 | 5.25 LAT to ACD Gap. |
... | ... | CAD model at LAT |
... | ... | ... | ... | |
ACD4-222 | The minimum ACD distance from
the LAT Trackers shall be as defined in ACD IDD (Interface Definition
Drawings) (LAT-DS-00309). |
Analysis | CAD model at LAT |
Verified at LAT | CAD model | Development, Acceptance | Verifed at LAT , inner survey succesful which veries dimension assuming LAT CAD models correct | See Test Report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/ , and ACD perf report ACD-RPT-000374 |
The
ACD shall cover the top and sides of (ACD3-22)(IN) |
ACD4-223 | 5.26 Material interaction of
gamma radiation (Gamma radiation due to ACD material interactions) |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-224 | The ACD shall cause interaction
of less than 6% of the incident gamma radiation. |
Analysis | n/a | ... | Development | N/A | ACD-RPT-000395, GLAST LAT ACD As-Built Gamma-Ray Absorption | (ACD4-226)(OUT) The thermal blanket/micrometeoroid shiel (ACD3-102)(IN) The ACD, support structure, and micromet (ACD3-24)(IN) |
|
ACD4-225 | 5.27 Thermal Blanket/
Micrometeoroid Shield Areal Mass Density |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-226 | The thermal
blanket/micrometeoroid shield shall have mass per unit area of ~
<0.32 g/cm2 which should minimize secondary gamma-ray
production by undetected cosmic ray interactions. |
Analysis | MMS/MLI spec (ACD-RQMT-000167), | ... | By design, MMS/MLI spec (ACD-RQMT-000167), details ACD-PLAN-000285), ACD-PROC-000356, ACDPLAN-000152, 2054591, 2054500, 2072262, 2054592 | Qualification, Acceptance | ACD-INT- 2317, 2157, 2326 Actual measured value 0.38 g/cm2 |
See WOAs ACD-RPT-000394, GLAST LAT ACD
As-Built Area Density of the ACD MMS/MLI |
N/A (ACD4-224)(IN) The thermal blanket/micrometeoroid shiel (ACD3-102)(IN) |
ACD4-227 | 5.28 Gaps between
scintillating tiles |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-228 | The gaps between scintillating
tiles shall be small enough over the operating temperature range to
meet the ACD efficiency requirement. See tile gap analysis trade study,
for latest simulation results available, which set gaps assumptions,
see Alex Moiseev. |
Analysis, Inspection, Simulation | n/a | N/A | TSA dwg As built gap table Thermal Analysis Structural Analysis Acoustical Analysis Post Tile Integration Inspection |
Acceptance | ACD-INT- 1626, 2122, 2065. Also see final GAP
report, ACD-RPT-000389 |
Performance Validation and Calibration, ACD-RPT-000372 | The
average detection efficiency for min (ACD3-20)(IN) |
ACD4-229 | 5.29 Light Throughput |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-230 | The amount of light transmitted
from the scintillating tiles to the PMT shall be sufficient to provide
required overall ACD efficiency of 0.9997. |
Test, Simulation | Fiber cable light throughput tests | Done | ACD Comprehensive Performance Test (CPT)
(ACD-PROC-000270) ACD Margin Test (ACD-PROC-000352) Also SEE GLAST LAT ACD Performance Summary from Environmental Testing ACD-RPT-000374 |
Qualification, Acceptance | ACD-INT-02318 ACD-INT-02309 (MARGIN TEST) Also SEE GLAST LAT ACD Performance Summary from Environmental Testing ACD-RPT-000374 |
ACD perf report ACD-RPT-000374, and
ACD-RPT-000372. Also see ACD test report web site http://glast.gsfc.nasa.gov/acd/internal/data/FUll-ACD-IT/
|
The
average detection efficiency for min (ACD3-20)(IN) |
ACD4-845 | 6 VERIFICATION STRATEGY |
... | ... | ... | ... | ... | ... | ... | ... |
ACD4-846 | The verification strategy will
test, analyze (may include modeling/simulation), inspect, or
demonstrate all requirements of section 5 to ensure that the instrument
meets the requirements of this specification. The matrix below
indicates the methods of verification employed to verify the science
performance. |
... | ... | ... | ... | ... | ... | ... | ... |