J.P. Duke, A.P. Letchford, D.J.S. Findlay (Rutherford Appleton Laboratory, Oxfordshire, England)
Measurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.
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